Structural and optical properties of thin lead oxide films produced by reactive direct current magnetron sputtering

The structural and optical properties of thin lead oxide films were studied. Thin films were prepared by reactive dc magnetron sputtering of lead (Pb) targets in an Ar/O 2 mixture. The structure has been determined by x-ray diffraction measurements, which show that crystalline lead oxide films of di...

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Veröffentlicht in:	Journal of vacuum science & technology. A, Vacuum, surfaces, and films Vacuum, surfaces, and films, 2001-11, Vol.19 (6), p.2870-2878
Hauptverfasser:	Venkataraj, S., Geurts, Jean, Weis, Hansjörg, Kappertz, Oliver, Njoroge, Walter K., Jayavel, R., Wuttig, Matthias
Format:	Artikel
Sprache:	eng
Schlagworte:	Annealing Crystalline materials Dielectric films Energy gap Lead compounds Light reflection Magnetron sputtering Raman spectroscopy Refractive index X ray diffraction analysis
Online-Zugang:	Volltext
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