Exploring enhanced CNN for predicting semiconductor device health compared to support vector machine

The goal of this research is to improve the accuracy of semiconductor device health prediction by comparing the efficacy of Enhanced CNN with the Support Vector Machine technique. Support vector machines and Novel Enhanced CNN were the two groups that were used. The parameters were a G-Power of 80%,...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Kumar, C. V. S., Sheela, J. J. J., Chandrasekharan, N.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Algorithms Predictions Semiconductor devices Support vector machines
Online-Zugang:	Volltext
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