High-β lasing in photonic-defect semiconductor-dielectric hybrid microresonators with embedded InGaAs quantum dots
We report an easy-to-fabricate microcavity design to produce optically pumped high-β quantum dot microlasers. Our cavity concept is based on a buried photonic-defect for tight lateral mode confinement in a quasi-planar microcavity system, which includes an upper dielectric distributed Bragg reflecto...
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Veröffentlicht in: | Applied physics letters 2024-01, Vol.124 (4) |
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creator | Gaur, Kartik Shih, Ching-Wen Limame, Imad Koulas-Simos, Aris Heermeier, Niels Palekar, Chirag C. Tripathi, Sarthak Rodt, Sven Reitzenstein, Stephan |
description | We report an easy-to-fabricate microcavity design to produce optically pumped high-β quantum dot microlasers. Our cavity concept is based on a buried photonic-defect for tight lateral mode confinement in a quasi-planar microcavity system, which includes an upper dielectric distributed Bragg reflector (DBR) as a promising alternative to conventional III–V semiconductor DBRs. The cavities show distinct emission features with a characteristic photonic-defect size-dependent mode separation and Q-factors up to 17 000. Comprehensive investigations further reveal lasing operation with a systematic increase (decrease) of the β-factor (threshold pump power) with the number of mirror pairs in the upper dielectric DBR. Notably, due to the quasi-planar device geometry, the microlasers show high temperature stability, evidenced by the absence of temperature-induced redshift of emission energy and linewidth broadening typically observed for nano- and microlasers at high excitation powers. The device exhibits remarkable lasing performance, maintaining efficacy even under elevated temperatures of up to 260 K. |
doi_str_mv | 10.1063/5.0177393 |
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Our cavity concept is based on a buried photonic-defect for tight lateral mode confinement in a quasi-planar microcavity system, which includes an upper dielectric distributed Bragg reflector (DBR) as a promising alternative to conventional III–V semiconductor DBRs. The cavities show distinct emission features with a characteristic photonic-defect size-dependent mode separation and Q-factors up to 17 000. Comprehensive investigations further reveal lasing operation with a systematic increase (decrease) of the β-factor (threshold pump power) with the number of mirror pairs in the upper dielectric DBR. Notably, due to the quasi-planar device geometry, the microlasers show high temperature stability, evidenced by the absence of temperature-induced redshift of emission energy and linewidth broadening typically observed for nano- and microlasers at high excitation powers. The device exhibits remarkable lasing performance, maintaining efficacy even under elevated temperatures of up to 260 K.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/5.0177393</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Bragg reflectors ; Defects ; Dielectrics ; Emission ; Group III-V semiconductors ; High temperature ; Holes ; Lasing ; Microlasers ; Photonics ; Quantum dots ; Red shift</subject><ispartof>Applied physics letters, 2024-01, Vol.124 (4)</ispartof><rights>Author(s)</rights><rights>2024 Author(s). 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Our cavity concept is based on a buried photonic-defect for tight lateral mode confinement in a quasi-planar microcavity system, which includes an upper dielectric distributed Bragg reflector (DBR) as a promising alternative to conventional III–V semiconductor DBRs. The cavities show distinct emission features with a characteristic photonic-defect size-dependent mode separation and Q-factors up to 17 000. Comprehensive investigations further reveal lasing operation with a systematic increase (decrease) of the β-factor (threshold pump power) with the number of mirror pairs in the upper dielectric DBR. Notably, due to the quasi-planar device geometry, the microlasers show high temperature stability, evidenced by the absence of temperature-induced redshift of emission energy and linewidth broadening typically observed for nano- and microlasers at high excitation powers. The device exhibits remarkable lasing performance, maintaining efficacy even under elevated temperatures of up to 260 K.</description><subject>Bragg reflectors</subject><subject>Defects</subject><subject>Dielectrics</subject><subject>Emission</subject><subject>Group III-V semiconductors</subject><subject>High temperature</subject><subject>Holes</subject><subject>Lasing</subject><subject>Microlasers</subject><subject>Photonics</subject><subject>Quantum dots</subject><subject>Red shift</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><recordid>eNp90M1KAzEQAOAgCtbqwTcIeFJIzc9ms3ssRdtCwYuel2yS7aZ0kzbJIn0tH8RnMlLPnoaZ-ZhhBoB7gmcEl-yZzzARgtXsAkwIFgIxQqpLMMEYM1TWnFyDmxh3OeWUsQmIK7vt0fcX3Mto3RZaBw-9T95ZhbTpjEowmsEq7_Sokg9IW7PP1WAV7E9tsBrmbvDBRO9kBhF-2tRDM7RGa6Ph2i3lPMLjKF0aB6h9irfgqpP7aO7-4hR8vL68L1Zo87ZcL-YbpBgVCWnBOi0Kwo3grKSGqLagRUvbitGCs4J3DFNdGky5lEVLKiq0KpUynNSVUYpNwcN57iH442hianZ-DC6vbGhNRFnUnJKsHs8qXxFjMF1zCHaQ4dQQ3Pz-tOHN30-zfTrbqGySyXr3D_4B_BB4Sw</recordid><startdate>20240122</startdate><enddate>20240122</enddate><creator>Gaur, Kartik</creator><creator>Shih, Ching-Wen</creator><creator>Limame, Imad</creator><creator>Koulas-Simos, Aris</creator><creator>Heermeier, Niels</creator><creator>Palekar, Chirag C.</creator><creator>Tripathi, Sarthak</creator><creator>Rodt, Sven</creator><creator>Reitzenstein, Stephan</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0001-9340-8264</orcidid><orcidid>https://orcid.org/0009-0003-2807-8424</orcidid><orcidid>https://orcid.org/0009-0004-6057-4839</orcidid><orcidid>https://orcid.org/0009-0008-1580-135X</orcidid><orcidid>https://orcid.org/0000-0001-6275-4965</orcidid><orcidid>https://orcid.org/0000-0002-1381-9838</orcidid><orcidid>https://orcid.org/0000-0002-2027-4303</orcidid><orcidid>https://orcid.org/0009-0003-6483-7862</orcidid></search><sort><creationdate>20240122</creationdate><title>High-β lasing in photonic-defect semiconductor-dielectric hybrid microresonators with embedded InGaAs quantum dots</title><author>Gaur, Kartik ; Shih, Ching-Wen ; Limame, Imad ; Koulas-Simos, Aris ; Heermeier, Niels ; Palekar, Chirag C. ; Tripathi, Sarthak ; Rodt, Sven ; Reitzenstein, Stephan</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c327t-d73fd7415e75362e1cb424b2b83245345f302d6e025aa4b1827dc6cce5198ecc3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>Bragg reflectors</topic><topic>Defects</topic><topic>Dielectrics</topic><topic>Emission</topic><topic>Group III-V semiconductors</topic><topic>High temperature</topic><topic>Holes</topic><topic>Lasing</topic><topic>Microlasers</topic><topic>Photonics</topic><topic>Quantum dots</topic><topic>Red shift</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Gaur, Kartik</creatorcontrib><creatorcontrib>Shih, Ching-Wen</creatorcontrib><creatorcontrib>Limame, Imad</creatorcontrib><creatorcontrib>Koulas-Simos, Aris</creatorcontrib><creatorcontrib>Heermeier, Niels</creatorcontrib><creatorcontrib>Palekar, Chirag C.</creatorcontrib><creatorcontrib>Tripathi, Sarthak</creatorcontrib><creatorcontrib>Rodt, Sven</creatorcontrib><creatorcontrib>Reitzenstein, Stephan</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Gaur, Kartik</au><au>Shih, Ching-Wen</au><au>Limame, Imad</au><au>Koulas-Simos, Aris</au><au>Heermeier, Niels</au><au>Palekar, Chirag C.</au><au>Tripathi, Sarthak</au><au>Rodt, Sven</au><au>Reitzenstein, Stephan</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>High-β lasing in photonic-defect semiconductor-dielectric hybrid microresonators with embedded InGaAs quantum dots</atitle><jtitle>Applied physics letters</jtitle><date>2024-01-22</date><risdate>2024</risdate><volume>124</volume><issue>4</issue><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>We report an easy-to-fabricate microcavity design to produce optically pumped high-β quantum dot microlasers. 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subjects | Bragg reflectors Defects Dielectrics Emission Group III-V semiconductors High temperature Holes Lasing Microlasers Photonics Quantum dots Red shift |
title | High-β lasing in photonic-defect semiconductor-dielectric hybrid microresonators with embedded InGaAs quantum dots |
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