Characterization of a retroreflector array for 320-GHz interferometer system in Heliotron J

A retroreflector array, composed of a cluster of small retroreflectors, is experimentally studied for application to a Michelson-type interferometer system in the fusion plasma experiment. Such a new-type reflector has the potential to be a vital and effective tool at a spatially limited location, s...

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Veröffentlicht in:Review of scientific instruments 2023-09, Vol.94 (9)
Hauptverfasser: Zhang, P., Ohshima, S., Zhao, H., Kobayashi, S., Kado, S., Minami, T., Kin, F., Miyashita, A., Iwata, A., Kondo, Y., Qiu, D., Wang, C., Luo, M., Konoshima, S., Inagaki, S., Okada, H., Mizuuchi, T., Nagasaki, K.
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container_issue 9
container_start_page
container_title Review of scientific instruments
container_volume 94
creator Zhang, P.
Ohshima, S.
Zhao, H.
Kobayashi, S.
Kado, S.
Minami, T.
Kin, F.
Miyashita, A.
Iwata, A.
Kondo, Y.
Qiu, D.
Wang, C.
Luo, M.
Konoshima, S.
Inagaki, S.
Okada, H.
Mizuuchi, T.
Nagasaki, K.
description A retroreflector array, composed of a cluster of small retroreflectors, is experimentally studied for application to a Michelson-type interferometer system in the fusion plasma experiment. Such a new-type reflector has the potential to be a vital and effective tool at a spatially limited location, such as on the vacuum chamber wall of plasma experimental devices. To investigate the effect of retroreflector array on the reflected beam properties, a tabletop experiment is performed with the retroreflector array composed of 4 mm corner-cube retroreflectors and with a 320-GHz (λ ∼ 0.937 mm) submillimeter wave source. An imaging camera is utilized to measure the submillimeter wave beam profile and is scanned perpendicularly to the beam propagation direction if necessary. The experimental result exhibits a diffraction effect on the reflected beam, resulting in the emergence of discrete peaks on the reflected beam profile, as predicted in the past numerical study; however, the most reflected beam power converges on the one reflected into the incident direction, resulting from a property as a retroreflector. Furthermore, the dependence of the reflected beam on the incident beam angle is characterized while fixing the detector position, and the retroreflection beam intensity is found to vary due to the diffraction effect. Such an undesired variation of beam intensity induced by the diffraction can be suppressed with a focusing lens placed in front of the detector in the practical application to an interferometer.
doi_str_mv 10.1063/5.0162649
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Such a new-type reflector has the potential to be a vital and effective tool at a spatially limited location, such as on the vacuum chamber wall of plasma experimental devices. To investigate the effect of retroreflector array on the reflected beam properties, a tabletop experiment is performed with the retroreflector array composed of 4 mm corner-cube retroreflectors and with a 320-GHz (λ ∼ 0.937 mm) submillimeter wave source. An imaging camera is utilized to measure the submillimeter wave beam profile and is scanned perpendicularly to the beam propagation direction if necessary. The experimental result exhibits a diffraction effect on the reflected beam, resulting in the emergence of discrete peaks on the reflected beam profile, as predicted in the past numerical study; however, the most reflected beam power converges on the one reflected into the incident direction, resulting from a property as a retroreflector. 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Furthermore, the dependence of the reflected beam on the incident beam angle is characterized while fixing the detector position, and the retroreflection beam intensity is found to vary due to the diffraction effect. 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source AIP Journals Complete; Alma/SFX Local Collection
subjects Arrays
Beams (radiation)
Diffraction
Heliotrons
Interferometers
Retroreflection
Retroreflectors
Scientific apparatus & instruments
Submillimeter waves
Vacuum chambers
title Characterization of a retroreflector array for 320-GHz interferometer system in Heliotron J
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