Increasing the scan speed in high resolution, low energy electron diffraction measurements by presetting the gate time
We report on a speed-up data acquisition routine for recording intensities in reciprocal space (k-space) with increased scan speed by a single point detector. It is designed for recording low energy electron diffraction (LEED) data with high resolution by a spot profile analysis LEED instrument. It...
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Veröffentlicht in: | Review of scientific instruments 2023-06, Vol.94 (6) |
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