Increasing the scan speed in high resolution, low energy electron diffraction measurements by presetting the gate time

We report on a speed-up data acquisition routine for recording intensities in reciprocal space (k-space) with increased scan speed by a single point detector. It is designed for recording low energy electron diffraction (LEED) data with high resolution by a spot profile analysis LEED instrument. It...

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Veröffentlicht in:Review of scientific instruments 2023-06, Vol.94 (6)
Hauptverfasser: Kny, Anna J., Sokolowski, Moritz, Kury, Peter
Format: Artikel
Sprache:eng
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