Scanning probe microscope probe switching unit with electrical measurement for in situ multifunctional characterization: Design and preliminary application in tribocorrosion investigation

Scanning probe microscope (SPM) is a potent tool in nanotribology research. However, commercial environment control SPMs can install only one probe to perform one function at a time. Accordingly, this study developed a probe switching unit with electrical measurement for in situ multifunctional char...

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Veröffentlicht in:	Journal of applied physics 2022-09, Vol.132 (10)
Hauptverfasser:	Chen, Yushan, Xu, Wenbin, Jiang, Liang, Qian, Linmao
Format:	Artikel
Sprache:	eng
Schlagworte:	Assembly Corrosive wear Electric contacts Electrical measurement Galvanic corrosion Microscopes Nanotribology Oxide coatings Rotation Scanning probe microscopes Substrates Switching Tantalum
Online-Zugang:	Volltext
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