A new approach to electrically detected magnetic resonance: Spin-dependent transient spectroscopy

Electrically detected magnetic resonance (EDMR) is arguably the most sensitive method available to study electrically active point defects in semiconductor devices. Most EDMR studies have utilized spin-dependent recombination current and, thus, require p–n junctions or a photoconductive structure. S...

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Veröffentlicht in:	Journal of applied physics 2022-09, Vol.132 (11)
Hauptverfasser:	Myers, Kenneth J., Lenahan, Patrick M., Ashton, James P., Ryan, Jason T.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied physics Deep level transient spectroscopy Electrical junctions Energy distribution Energy levels Magnetic resonance Magnetoresistance Magnetoresistivity Metal oxide semiconductors P-n junctions Point defects Semiconductor devices
Online-Zugang:	Volltext
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