Secondary electron yield characterization of high porosity surfaces for multipactor-free microwave components

We present secondary electron yield (SEY) characterization of high porosity surfaces for multipactor-free microwave components. We first calculate the SEYs of through porosity surfaces using Monte Carlo simulations. We demonstrate that these high porosity surfaces can be treated as homogeneous mater...

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Veröffentlicht in:	Physics of plasmas 2022-08, Vol.29 (8)
Hauptverfasser:	Mirmozafari, M., Iqbal, A., Zhang, P., Behdad, N., Booske, J. H., Verboncoeur, J. P.
Format:	Artikel
Sprache:	eng
Schlagworte:	Plasma physics Porosity Reduction
Online-Zugang:	Volltext
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