Electron overflow of AlGaN deep ultraviolet light emitting diodes
We have studied the design, epitaxy, and performance characteristics of deep ultraviolet (UV) AlGaN light emitting diodes (LEDs). By combining the tunnel junction and polarization-engineered AlGaN electron blocking layer, a maximum external quantum efficiency and wall-plug efficiency of 0.35% and 0....
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Veröffentlicht in: | Applied physics letters 2021-06, Vol.118 (24) |
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description | We have studied the design, epitaxy, and performance characteristics of deep ultraviolet (UV) AlGaN light emitting diodes (LEDs). By combining the tunnel junction and polarization-engineered AlGaN electron blocking layer, a maximum external quantum efficiency and wall-plug efficiency of 0.35% and 0.21%, respectively, were measured for devices operating at ∼245 nm, which are over one order of magnitude higher than previously reported tunnel junction devices at this wavelength. Severe efficiency droop, however, was measured at very low current densities (∼0.25 A/cm2), which, together with the transverse magnetic (TM) polarized emission, is identified to be the primary limiting factors for the device performance. Detailed electrical and optical analysis further shows that the observed efficiency droop is largely due to an electrical effect instead of an optical phenomenon. Our studies suggest that AlGaN deep UV LEDs with efficiency comparable to InGaN blue-emitting quantum wells can be potentially achieved if issues related to electron overflow and TM polarized emission are effectively addressed. |
doi_str_mv | 10.1063/5.0055326 |
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By combining the tunnel junction and polarization-engineered AlGaN electron blocking layer, a maximum external quantum efficiency and wall-plug efficiency of 0.35% and 0.21%, respectively, were measured for devices operating at ∼245 nm, which are over one order of magnitude higher than previously reported tunnel junction devices at this wavelength. Severe efficiency droop, however, was measured at very low current densities (∼0.25 A/cm2), which, together with the transverse magnetic (TM) polarized emission, is identified to be the primary limiting factors for the device performance. Detailed electrical and optical analysis further shows that the observed efficiency droop is largely due to an electrical effect instead of an optical phenomenon. Our studies suggest that AlGaN deep UV LEDs with efficiency comparable to InGaN blue-emitting quantum wells can be potentially achieved if issues related to electron overflow and TM polarized emission are effectively addressed.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/5.0055326</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Aluminum gallium nitrides ; Applied physics ; Efficiency ; Electrons ; Light emitting diodes ; Low currents ; Overflow ; Quantum efficiency ; Quantum wells ; Tunnel junctions ; Ultraviolet radiation</subject><ispartof>Applied physics letters, 2021-06, Vol.118 (24)</ispartof><rights>Author(s)</rights><rights>2021 Author(s). 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By combining the tunnel junction and polarization-engineered AlGaN electron blocking layer, a maximum external quantum efficiency and wall-plug efficiency of 0.35% and 0.21%, respectively, were measured for devices operating at ∼245 nm, which are over one order of magnitude higher than previously reported tunnel junction devices at this wavelength. Severe efficiency droop, however, was measured at very low current densities (∼0.25 A/cm2), which, together with the transverse magnetic (TM) polarized emission, is identified to be the primary limiting factors for the device performance. Detailed electrical and optical analysis further shows that the observed efficiency droop is largely due to an electrical effect instead of an optical phenomenon. Our studies suggest that AlGaN deep UV LEDs with efficiency comparable to InGaN blue-emitting quantum wells can be potentially achieved if issues related to electron overflow and TM polarized emission are effectively addressed.</description><subject>Aluminum gallium nitrides</subject><subject>Applied physics</subject><subject>Efficiency</subject><subject>Electrons</subject><subject>Light emitting diodes</subject><subject>Low currents</subject><subject>Overflow</subject><subject>Quantum efficiency</subject><subject>Quantum wells</subject><subject>Tunnel junctions</subject><subject>Ultraviolet radiation</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><recordid>eNqd0E1LAzEQBuAgCtbqwX8Q8KSwNdk0X8dSahWKXvQcspukpqSbNUkr_nu3tODd0zDMw8zwAnCL0QQjRh7pBCFKSc3OwAgjziuCsTgHI4QQqZik-BJc5bwZWloTMgKzRbBtSbGDcW-TC_EbRgdnYalfobG2h7tQkt77GGyBwa8_C7RbX4rv1tD4aGy-BhdOh2xvTnUMPp4W7_PnavW2fJnPVlVLMCHDH84J02rBNW9cI5lsmJTSGS5szQ2WyGjEjJxqhgyzArdG2CnGSNSHeUPG4O64t0_xa2dzUZu4S91wUtV0WmMkOSODuj-qNsWck3WqT36r04_CSB0SUlSdEhrsw9Hm1hddfOz-h_cx_UHVG0d-ARxtc2s</recordid><startdate>20210614</startdate><enddate>20210614</enddate><creator>Pandey, A.</creator><creator>Gim, J.</creator><creator>Hovden, R.</creator><creator>Mi, Z.</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0001-9494-7390</orcidid><orcidid>https://orcid.org/0000-0002-9582-3709</orcidid><orcidid>https://orcid.org/0000-0001-7499-873X</orcidid><orcidid>https://orcid.org/0000-0002-3403-8803</orcidid></search><sort><creationdate>20210614</creationdate><title>Electron overflow of AlGaN deep ultraviolet light emitting diodes</title><author>Pandey, A. ; Gim, J. ; Hovden, R. ; Mi, Z.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3133-31ff8dca87a7bfb969b6999fd78e27d190da06d94a60d6e81cd8e411082e27db3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Aluminum gallium nitrides</topic><topic>Applied physics</topic><topic>Efficiency</topic><topic>Electrons</topic><topic>Light emitting diodes</topic><topic>Low currents</topic><topic>Overflow</topic><topic>Quantum efficiency</topic><topic>Quantum wells</topic><topic>Tunnel junctions</topic><topic>Ultraviolet radiation</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Pandey, A.</creatorcontrib><creatorcontrib>Gim, J.</creatorcontrib><creatorcontrib>Hovden, R.</creatorcontrib><creatorcontrib>Mi, Z.</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Pandey, A.</au><au>Gim, J.</au><au>Hovden, R.</au><au>Mi, Z.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Electron overflow of AlGaN deep ultraviolet light emitting diodes</atitle><jtitle>Applied physics letters</jtitle><date>2021-06-14</date><risdate>2021</risdate><volume>118</volume><issue>24</issue><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>We have studied the design, epitaxy, and performance characteristics of deep ultraviolet (UV) AlGaN light emitting diodes (LEDs). By combining the tunnel junction and polarization-engineered AlGaN electron blocking layer, a maximum external quantum efficiency and wall-plug efficiency of 0.35% and 0.21%, respectively, were measured for devices operating at ∼245 nm, which are over one order of magnitude higher than previously reported tunnel junction devices at this wavelength. Severe efficiency droop, however, was measured at very low current densities (∼0.25 A/cm2), which, together with the transverse magnetic (TM) polarized emission, is identified to be the primary limiting factors for the device performance. Detailed electrical and optical analysis further shows that the observed efficiency droop is largely due to an electrical effect instead of an optical phenomenon. 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subjects | Aluminum gallium nitrides Applied physics Efficiency Electrons Light emitting diodes Low currents Overflow Quantum efficiency Quantum wells Tunnel junctions Ultraviolet radiation |
title | Electron overflow of AlGaN deep ultraviolet light emitting diodes |
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