Gradual conductance modulation of Ti/WOx/Pt memristor with self-rectification for a neuromorphic system

In this study, we present an analysis of the gradually modulated conductance of the Ti/WOx/Pt memristor. The deposited material layers were verified by transmission electron microscopy, energy-dispersive x-ray spectroscopy, and x-ray photoelectron spectroscopy. The results revealed that the current...

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Veröffentlicht in:	Applied physics letters 2021-07, Vol.119 (1)
Hauptverfasser:	Shin, Jiwoong, Kang, Myounggon, Kim, Sungjun
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied physics Arrays Memristors Pattern recognition Photoelectrons Resistance Spectrum analysis X-ray spectroscopy
Online-Zugang:	Volltext
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