Microstructures in thin Bi2Te3 films according to transmission electron microscopy

Microstructures in thin Bi2Te3 films according to transmission electron microscopy

Thin Bi2Te3 films with a specially created thickness gradient were obtained by thermal deposition in vacuum. The methods of transmission electron microscopy in films revealed crystallographic orientations of the [100] and [2-21] tellurium phases. The method of bending contours in the films revealed...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Kolosov, V. Yu, Yushkov, A. A.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Bending
Bismuth tellurides
Crystal lattices
Crystallography
Electrons
Microscopes
Tellurium
Thin films
Transmission electron microscopy
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Beschreibung
Zusammenfassung:Thin Bi2Te3 films with a specially created thickness gradient were obtained by thermal deposition in vacuum. The methods of transmission electron microscopy in films revealed crystallographic orientations of the [100] and [2-21] tellurium phases. The method of bending contours in the films revealed a significant internal bending of the crystal lattice, reaching 150 deg / µm.
ISSN:0094-243X
1551-7616
DOI:10.1063/5.0033544