Monochromatic electron emission from CeB6 (310) cold field emitter

Observation at low voltage using scanning electron microscopes (SEMs) enables the characterization of surface details on specimens on a nanometer scale and is widely used in science and industry. However, the energy width of the electron source restricts the spatial resolution of SEMs at low voltage...

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Veröffentlicht in:	Applied physics letters 2020-11, Vol.117 (21)
Hauptverfasser:	Kasuya, Keigo, Kusunoki, Toshiaki, Hashizume, Tomihiro, Ohshima, Takashi, Katagiri, Souichi, Sakai, Yusuke, Arai, Noriaki
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied physics Cerium Electron emission Emitters Emitters (electron) Low voltage Microscopes Scanning electron microscopy Single crystals Spatial resolution Work functions
Online-Zugang:	Volltext
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