Mid-IR photothermal measurement of substantial heat transport by surface waves of polar amorphous films supported on silicon

We present measurements of significant thermal diffusivity by surface electromagnetic waves of an ultra-thin polar and amorphous dielectric film deposited on silicon (Si). We used a photothermal-beam-deflection technique with a modulated mid-infrared heating source to excite and launch surface elect...

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Veröffentlicht in:	Journal of applied physics 2020-09, Vol.128 (9)
Hauptverfasser:	Hamyeh, S., Tauk, R., Adam, P.-M., Kazan, M.
Format:	Artikel
Sprache:	eng
Schlagworte:	Amorphous materials Amorphous silicon Anisotropy Diffusivity Electromagnetic radiation Infrared heating Photothermal deflection spectroscopy Physics Refractivity Silicon carbide Solid surfaces Surface waves Thermal diffusivity Thickness Wave propagation
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