Radiation enhanced oxidation of proton-irradiated copper thin-films: Towards a new concept of ultra-high radiation dosimetry

The effects of extreme radiation levels on the electrical resistivity of metal thin films made of copper were studied by means of electrical measurements and post irradiation imaging. Different 3x3 mm2 chips were produced by depositing 500 nm of meander shaped copper on top of a silicon substrate. A...

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Veröffentlicht in:	AIP advances 2019-08, Vol.9 (8), p.085217-085217-8
Hauptverfasser:	Gorine, Georgi, Pezzullo, Giuseppe, Bouvet, Didier, Ravotti, Federico, Sallese, Jean-Michel
Format:	Artikel
Sprache:	eng
Schlagworte:	Copper Copper oxides Damage accumulation Dosimeters Electrical measurement Electrical resistivity Fluence Grain boundaries Oxidation Oxidation resistance Oxide coatings Proton irradiation Radiation damage Radiation measurement Radiation tolerance Silicon dioxide Silicon substrates Thin films
Online-Zugang:	Volltext
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