Probing the exciton-phonon coupling strengths of O-polar and Zn-polar ZnO wafer using hard X-ray excited optical luminescence

The temperature-dependent hard X-ray excited optical luminescence (XEOL) spectroscopy was used to study the optical properties of O and Zn polarity of a c-plane single crystal ZnO wafer. By analyzing the XEOL and XRD, we found an unprecedented blue shift of the free exciton transition with increasin...

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Veröffentlicht in:	Applied physics letters 2016-11, Vol.109 (19)
Hauptverfasser:	Lin, Bi-Hsuan, Chen, Huang-Yeh, Tseng, Shao-Chin, Wu, Jian-Xing, Chen, Bo-Yi, Lee, Chien-Yu, Yin, Gung-Chian, Chang, Shih-Hung, Tang, Mau-Tsu, Hsieh, Wen-Feng
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied physics Blue shift Carrier density Crystal structure Excitons Luminescence Optical properties Polarity Single crystals Temperature dependence Zinc oxide
Online-Zugang:	Volltext
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