Dielectric relaxation studies in Se90Cd8Sb2 glassy alloy
Se90Cd8Sb2 chalcogenide semiconducting alloy was prepared by melt quench technique. The prepared glassy alloy has been characterized by techniques such as scanning electron microscopy (SEM) and energy dispersive X-ray (EDAX).Dielectric properties of Se90Cd8Sb2 chalcogenide semiconductor have been st...
Gespeichert in:
Hauptverfasser: | , , |
---|---|
Format: | Tagungsbericht |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | Se90Cd8Sb2 chalcogenide semiconducting alloy was prepared by melt quench technique. The prepared glassy alloy has been characterized by techniques such as scanning electron microscopy (SEM) and energy dispersive X-ray (EDAX).Dielectric properties of Se90Cd8Sb2 chalcogenide semiconductor have been studied using impedance spectroscopic technique in the frequency range 5×102Hz - 1×105Hz and in temperature range 303-318K. It is found that dielectric constant ε′ and dielectric loss factor ε″ are dependent on frequency and temperature. |
---|---|
ISSN: | 0094-243X 1551-7616 |
DOI: | 10.1063/1.4946434 |