Quantitative measurements of shear displacement using atomic force microscopy

We report a method to quantitatively measure local shear deformation with high sensitivity using atomic force microscopy. The key point is to simultaneously detect both torsional and buckling motions of atomic force microscopy (AFM) cantilevers induced by the lateral piezoelectric response of the sa...

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Veröffentlicht in:	Applied physics letters 2016-03, Vol.108 (12)
Hauptverfasser:	Wang, Wenbo, Sun, Ying, Zhao, Yonggang, Wu, Weida
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied physics Atomic force microscopy Buckling Dependence Microscopes Microscopy Piezoelectricity Shear deformation Torsion
Online-Zugang:	Volltext
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