Removing interference and optical feedback artifacts in atomic force microscopy measurements by application of high frequency laser current modulation
Atomic force microscopy measurements based on optical beam deflection can seriously be affected by two specific types of artifacts. Disturbances of the first type are caused by interference on the quadrant photodiode between the beam reflected directly from the cantilever and stray light from the sa...
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| Veröffentlicht in: | Review of scientific instruments 2004-03, Vol.75 (3), p.689-693 |
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| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
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