Removing interference and optical feedback artifacts in atomic force microscopy measurements by application of high frequency laser current modulation

Removing interference and optical feedback artifacts in atomic force microscopy measurements by application of high frequency laser current modulation

Atomic force microscopy measurements based on optical beam deflection can seriously be affected by two specific types of artifacts. Disturbances of the first type are caused by interference on the quadrant photodiode between the beam reflected directly from the cantilever and stray light from the sa...

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Veröffentlicht in:Review of scientific instruments 2004-03, Vol.75 (3), p.689-693
Hauptverfasser: Kassies, Roel, van der Werf, Kees O., Bennink, Martin L., Otto, Cees
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container_issue 3
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container_title Review of scientific instruments
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creator Kassies, Roel
van der Werf, Kees O.
Bennink, Martin L.
Otto, Cees
description Atomic force microscopy measurements based on optical beam deflection can seriously be affected by two specific types of artifacts. Disturbances of the first type are caused by interference on the quadrant photodiode between the beam reflected directly from the cantilever and stray light from the sample surface. The second type is optical feedback effects caused by light scattering from the surface back into the laser cavity. We demonstrate that both types can be significantly reduced by application of high frequency laser current modulation. Residual noise is dominated by electronic and mechanical noise, shot noise, and noise caused by the thermal motion of the cantilever.
doi_str_mv 10.1063/1.1646767
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fullrecord <record><control><sourceid>scitation_cross</sourceid><recordid>TN_cdi_scitation_primary_10_1063_1_1646767</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>rsi</sourcerecordid><originalsourceid>FETCH-LOGICAL-c363t-5ba402e9ab3784a8504857a85daf0ad301c0ad331532d20036eefd0b788fd7a73</originalsourceid><addsrcrecordid>eNqdkM1KAzEUhYMoWKsL3yBbhalJMzOZLqX4BwVBdD3cSW7a6MxkTNJCX8TnNf0B997NuYuPcw6HkGvOJpyV4o5PeJmXspQnZMRZNctkORWnZMSYyLNS5tU5uQjhk6UrOB-Rnzfs3Mb2S2r7iN6gx14hhV5TN0SroKUGUTegvij4aA2oGBJLIbrOKmqcT3j6vAvKDVvaIYS1xw77xDVbCsPQJptoXU-doSu7XFHj8Xudcra0hYCeqrVPsZF2Tq_bPXpJzgy0Aa-OOiYfjw_v8-ds8fr0Mr9fZEqUImZFAzmb4gwaIascqoLlVSGTajAMtGBc7UTwQkz1NG1QIhrNGllVRkuQYkxuDr67_sGjqQdvO_DbmrN6N2jN6-Ogib09sEHZuG_5P3jj_B9YD9qIX-AGiN0</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Removing interference and optical feedback artifacts in atomic force microscopy measurements by application of high frequency laser current modulation</title><source>AIP Journals Complete</source><source>AIP Digital Archive</source><creator>Kassies, Roel ; van der Werf, Kees O. ; Bennink, Martin L. ; Otto, Cees</creator><creatorcontrib>Kassies, Roel ; van der Werf, Kees O. ; Bennink, Martin L. ; Otto, Cees</creatorcontrib><description>Atomic force microscopy measurements based on optical beam deflection can seriously be affected by two specific types of artifacts. Disturbances of the first type are caused by interference on the quadrant photodiode between the beam reflected directly from the cantilever and stray light from the sample surface. The second type is optical feedback effects caused by light scattering from the surface back into the laser cavity. We demonstrate that both types can be significantly reduced by application of high frequency laser current modulation. Residual noise is dominated by electronic and mechanical noise, shot noise, and noise caused by the thermal motion of the cantilever.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.1646767</identifier><identifier>CODEN: RSINAK</identifier><language>eng</language><ispartof>Review of scientific instruments, 2004-03, Vol.75 (3), p.689-693</ispartof><rights>American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c363t-5ba402e9ab3784a8504857a85daf0ad301c0ad331532d20036eefd0b788fd7a73</citedby><cites>FETCH-LOGICAL-c363t-5ba402e9ab3784a8504857a85daf0ad301c0ad331532d20036eefd0b788fd7a73</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/rsi/article-lookup/doi/10.1063/1.1646767$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,780,784,794,1559,4512,27924,27925,76384,76390</link.rule.ids></links><search><creatorcontrib>Kassies, Roel</creatorcontrib><creatorcontrib>van der Werf, Kees O.</creatorcontrib><creatorcontrib>Bennink, Martin L.</creatorcontrib><creatorcontrib>Otto, Cees</creatorcontrib><title>Removing interference and optical feedback artifacts in atomic force microscopy measurements by application of high frequency laser current modulation</title><title>Review of scientific instruments</title><description>Atomic force microscopy measurements based on optical beam deflection can seriously be affected by two specific types of artifacts. Disturbances of the first type are caused by interference on the quadrant photodiode between the beam reflected directly from the cantilever and stray light from the sample surface. The second type is optical feedback effects caused by light scattering from the surface back into the laser cavity. We demonstrate that both types can be significantly reduced by application of high frequency laser current modulation. Residual noise is dominated by electronic and mechanical noise, shot noise, and noise caused by the thermal motion of the cantilever.</description><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2004</creationdate><recordtype>article</recordtype><recordid>eNqdkM1KAzEUhYMoWKsL3yBbhalJMzOZLqX4BwVBdD3cSW7a6MxkTNJCX8TnNf0B997NuYuPcw6HkGvOJpyV4o5PeJmXspQnZMRZNctkORWnZMSYyLNS5tU5uQjhk6UrOB-Rnzfs3Mb2S2r7iN6gx14hhV5TN0SroKUGUTegvij4aA2oGBJLIbrOKmqcT3j6vAvKDVvaIYS1xw77xDVbCsPQJptoXU-doSu7XFHj8Xudcra0hYCeqrVPsZF2Tq_bPXpJzgy0Aa-OOiYfjw_v8-ds8fr0Mr9fZEqUImZFAzmb4gwaIascqoLlVSGTajAMtGBc7UTwQkz1NG1QIhrNGllVRkuQYkxuDr67_sGjqQdvO_DbmrN6N2jN6-Ogib09sEHZuG_5P3jj_B9YD9qIX-AGiN0</recordid><startdate>200403</startdate><enddate>200403</enddate><creator>Kassies, Roel</creator><creator>van der Werf, Kees O.</creator><creator>Bennink, Martin L.</creator><creator>Otto, Cees</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>200403</creationdate><title>Removing interference and optical feedback artifacts in atomic force microscopy measurements by application of high frequency laser current modulation</title><author>Kassies, Roel ; van der Werf, Kees O. ; Bennink, Martin L. ; Otto, Cees</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c363t-5ba402e9ab3784a8504857a85daf0ad301c0ad331532d20036eefd0b788fd7a73</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2004</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kassies, Roel</creatorcontrib><creatorcontrib>van der Werf, Kees O.</creatorcontrib><creatorcontrib>Bennink, Martin L.</creatorcontrib><creatorcontrib>Otto, Cees</creatorcontrib><collection>CrossRef</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kassies, Roel</au><au>van der Werf, Kees O.</au><au>Bennink, Martin L.</au><au>Otto, Cees</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Removing interference and optical feedback artifacts in atomic force microscopy measurements by application of high frequency laser current modulation</atitle><jtitle>Review of scientific instruments</jtitle><date>2004-03</date><risdate>2004</risdate><volume>75</volume><issue>3</issue><spage>689</spage><epage>693</epage><pages>689-693</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>Atomic force microscopy measurements based on optical beam deflection can seriously be affected by two specific types of artifacts. Disturbances of the first type are caused by interference on the quadrant photodiode between the beam reflected directly from the cantilever and stray light from the sample surface. The second type is optical feedback effects caused by light scattering from the surface back into the laser cavity. We demonstrate that both types can be significantly reduced by application of high frequency laser current modulation. Residual noise is dominated by electronic and mechanical noise, shot noise, and noise caused by the thermal motion of the cantilever.</abstract><doi>10.1063/1.1646767</doi><tpages>5</tpages></addata></record>
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title Removing interference and optical feedback artifacts in atomic force microscopy measurements by application of high frequency laser current modulation
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T04%3A38%3A48IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-scitation_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Removing%20interference%20and%20optical%20feedback%20artifacts%20in%20atomic%20force%20microscopy%20measurements%20by%20application%20of%20high%20frequency%20laser%20current%20modulation&rft.jtitle=Review%20of%20scientific%20instruments&rft.au=Kassies,%20Roel&rft.date=2004-03&rft.volume=75&rft.issue=3&rft.spage=689&rft.epage=693&rft.pages=689-693&rft.issn=0034-6748&rft.eissn=1089-7623&rft.coden=RSINAK&rft_id=info:doi/10.1063/1.1646767&rft_dat=%3Cscitation_cross%3Ersi%3C/scitation_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true