Characterization of UV detectors at SURF III (invited)
The Synchrotron Ultraviolet Radiation Facility (SURF III) at the National Institute of Standards and Technology provides a unique research opportunity in precision measurements with its continuous and calculable radiation stretching from the soft x ray to the far infrared. In response to the rapid d...
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Veröffentlicht in: | Review of Scientific Instruments 2002-03, Vol.73 (3), p.1625-1628 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The Synchrotron Ultraviolet Radiation Facility (SURF III) at the National Institute of Standards and Technology provides a unique research opportunity in precision measurements with its continuous and calculable radiation stretching from the soft x ray to the far infrared. In response to the rapid development of ultraviolet photodetectors for applications ranging from industrial photolithography to astrophysics, we have developed measurement capabilities to characterize photodetectors with high accuracy. The absolute measurements at SURF III are based on a high-accuracy liquid-helium cooled cryogenic radiometer for measuring the power of the dispersed radiation from SURF III through a monochromator. Typical detector calibration uncertainties achieved at SURF III using cryogenic radiometer is better than 0.5% in the ultraviolet. Equipped with such a tool, we were able to study a variety of ultraviolet detectors and determine their spectral responsivities, surface reflectivities, and the effects of radiation damage. Due to the accuracy of these measurements, the internal quantum efficiencies of the photodetectors can be derived and theoretically modeled to provide information on the mechanism of photo detection. |
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ISSN: | 0034-6748 1089-7623 |
DOI: | 10.1063/1.1445825 |