Transient x-ray diffraction used to diagnose shock compressed Si crystals on the Nova laser

Transient x-ray diffraction is used to record time-resolved information about the shock compression of materials. This technique has been applied on Nova shock experiments driven using a hohlraum x-ray drive. Data were recorded from the shock release at the free surface of a Si crystal, as well as f...

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Veröffentlicht in:	Review of Scientific Instruments 1999-01, Vol.70 (1), p.629-632
Hauptverfasser:	Kalantar, D. H., Chandler, E. A., Colvin, J. D., Lee, R., Remington, B. A., Weber, S. V., Wiley, L. G., Hauer, A., Wark, J. S., Loveridge, A., Failor, B. H., Meyers, M. A., Ravichandran, G.
Format:	Artikel
Sprache:	eng
Schlagworte:	70 PLASMA PHYSICS AND FUSION COMPRESSION CRYSTAL STRUCTURE NOVA FACILITY PLASMA DIAGNOSTICS PLASMA SIMULATION SHOCK WAVES SILICON STRAINS TRANSIENTS X-RAY DIFFRACTION
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