Technique for the removal of electrons from an extracted, pulsed, H− ion beam

A small, permanent‐magnet insert structure for the removal of electrons from pulsed, extracted, negative ion beams has been developed at Lawrence Berkeley National Laboratory. The device was computer modeled and designed for an extraction field strength of 3 kV/mm. The testing was carried out with a...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Review of Scientific Instruments 1996-10, Vol.67 (10), p.3497-3500
Hauptverfasser:	Perkins, Luke T., Herz, P. R., Leung, K. N., Pickard, D. S.
Format:	Artikel
Sprache:	eng
Schlagworte:	BEAM EXTRACTION BEAM OPTICS COMPUTERIZED SIMULATION ELECTRONS HYDROGEN 1 MINUS BEAMS ION SOURCES KEV RANGE MAGNETIC FIELDS PHYSICS
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!