Technique for the removal of electrons from an extracted, pulsed, H− ion beam

Technique for the removal of electrons from an extracted, pulsed, H− ion beam

A small, permanent‐magnet insert structure for the removal of electrons from pulsed, extracted, negative ion beams has been developed at Lawrence Berkeley National Laboratory. The device was computer modeled and designed for an extraction field strength of 3 kV/mm. The testing was carried out with a...

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Veröffentlicht in:Review of Scientific Instruments 1996-10, Vol.67 (10), p.3497-3500
Hauptverfasser: Perkins, Luke T., Herz, P. R., Leung, K. N., Pickard, D. S.
Format: Artikel
Sprache:eng
Schlagworte:
BEAM EXTRACTION
BEAM OPTICS
COMPUTERIZED SIMULATION
ELECTRONS
HYDROGEN 1 MINUS BEAMS
ION SOURCES
KEV RANGE
MAGNETIC FIELDS
PHYSICS
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container_end_page 3500
container_issue 10
container_start_page 3497
container_title Review of Scientific Instruments
container_volume 67
creator Perkins, Luke T.
Herz, P. R.
Leung, K. N.
Pickard, D. S.
description A small, permanent‐magnet insert structure for the removal of electrons from pulsed, extracted, negative ion beams has been developed at Lawrence Berkeley National Laboratory. The device was computer modeled and designed for an extraction field strength of 3 kV/mm. The testing was carried out with a rf driven multicusp ion source optimized for the production of H− ions and pulsed at a few Hz with pulse widths of several hundreds of μs. It is demonstrated that the insert structure together with a collar can remove over 98% of electrons from the extracted H− ion beam without any significant deterioration of the H− ion output. Application to other negative ion beams can be expected from this magnetic collar insert.
doi_str_mv 10.1063/1.1147166
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fullrecord <record><control><sourceid>scitation_osti_</sourceid><recordid>TN_cdi_scitation_primary_10_1063_1_1147166</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>rsi</sourcerecordid><originalsourceid>FETCH-LOGICAL-c323t-88fe0fe3a6d7db2459c6f946f8a8ee13595b79fddc431d75cc8d6c3bf21bd16e3</originalsourceid><addsrcrecordid>eNqdkMFKAzEURYMoWKsL_yAuFUfzJjOZzFKKWqHQTV2HTPJCRzqTmqRF_8C1n-iXOKUF977Nhcfhcu8l5BLYHTDB7-EOoKhAiCMyAibrrBI5PyYjxniRiaqQp-Qsxjc2XAkwIvMFmmXfvm-QOh9oWiIN2PmtXlHvKK7QpOD7SF3wHdU9xY8UtElob-l6s4o7nf58fdPW97RB3Z2TE6eH_8VBx-T16XExmWaz-fPL5GGWGZ7zlEnpkDnkWtjKNnlR1ka4uhBOaokIvKzLpqqdtabgYKvSGGmF4Y3LobEgkI_J1d7Xx9SqaNo09DC-74fAistSymJgrveMCT7GgE6tQ9vp8KmAqd1aCtRhrYG92bM7K52GOv-Dtz78gWptHf8FwD95UQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Technique for the removal of electrons from an extracted, pulsed, H− ion beam</title><source>AIP Digital Archive</source><creator>Perkins, Luke T. ; Herz, P. R. ; Leung, K. N. ; Pickard, D. S.</creator><creatorcontrib>Perkins, Luke T. ; Herz, P. R. ; Leung, K. N. ; Pickard, D. S. ; Lawrence Berkeley National Laboratory</creatorcontrib><description>A small, permanent‐magnet insert structure for the removal of electrons from pulsed, extracted, negative ion beams has been developed at Lawrence Berkeley National Laboratory. The device was computer modeled and designed for an extraction field strength of 3 kV/mm. The testing was carried out with a rf driven multicusp ion source optimized for the production of H− ions and pulsed at a few Hz with pulse widths of several hundreds of μs. It is demonstrated that the insert structure together with a collar can remove over 98% of electrons from the extracted H− ion beam without any significant deterioration of the H− ion output. Application to other negative ion beams can be expected from this magnetic collar insert.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.1147166</identifier><identifier>CODEN: RSINAK</identifier><language>eng</language><publisher>United States</publisher><subject>BEAM EXTRACTION ; BEAM OPTICS ; COMPUTERIZED SIMULATION ; ELECTRONS ; HYDROGEN 1 MINUS BEAMS ; ION SOURCES ; KEV RANGE ; MAGNETIC FIELDS ; PHYSICS</subject><ispartof>Review of Scientific Instruments, 1996-10, Vol.67 (10), p.3497-3500</ispartof><rights>American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c323t-88fe0fe3a6d7db2459c6f946f8a8ee13595b79fddc431d75cc8d6c3bf21bd16e3</citedby><cites>FETCH-LOGICAL-c323t-88fe0fe3a6d7db2459c6f946f8a8ee13595b79fddc431d75cc8d6c3bf21bd16e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/rsi/article-lookup/doi/10.1063/1.1147166$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,777,781,882,1554,27905,27906,76139</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/385884$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Perkins, Luke T.</creatorcontrib><creatorcontrib>Herz, P. R.</creatorcontrib><creatorcontrib>Leung, K. N.</creatorcontrib><creatorcontrib>Pickard, D. S.</creatorcontrib><creatorcontrib>Lawrence Berkeley National Laboratory</creatorcontrib><title>Technique for the removal of electrons from an extracted, pulsed, H− ion beam</title><title>Review of Scientific Instruments</title><description>A small, permanent‐magnet insert structure for the removal of electrons from pulsed, extracted, negative ion beams has been developed at Lawrence Berkeley National Laboratory. The device was computer modeled and designed for an extraction field strength of 3 kV/mm. The testing was carried out with a rf driven multicusp ion source optimized for the production of H− ions and pulsed at a few Hz with pulse widths of several hundreds of μs. It is demonstrated that the insert structure together with a collar can remove over 98% of electrons from the extracted H− ion beam without any significant deterioration of the H− ion output. Application to other negative ion beams can be expected from this magnetic collar insert.</description><subject>BEAM EXTRACTION</subject><subject>BEAM OPTICS</subject><subject>COMPUTERIZED SIMULATION</subject><subject>ELECTRONS</subject><subject>HYDROGEN 1 MINUS BEAMS</subject><subject>ION SOURCES</subject><subject>KEV RANGE</subject><subject>MAGNETIC FIELDS</subject><subject>PHYSICS</subject><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1996</creationdate><recordtype>article</recordtype><recordid>eNqdkMFKAzEURYMoWKsL_yAuFUfzJjOZzFKKWqHQTV2HTPJCRzqTmqRF_8C1n-iXOKUF977Nhcfhcu8l5BLYHTDB7-EOoKhAiCMyAibrrBI5PyYjxniRiaqQp-Qsxjc2XAkwIvMFmmXfvm-QOh9oWiIN2PmtXlHvKK7QpOD7SF3wHdU9xY8UtElob-l6s4o7nf58fdPW97RB3Z2TE6eH_8VBx-T16XExmWaz-fPL5GGWGZ7zlEnpkDnkWtjKNnlR1ka4uhBOaokIvKzLpqqdtabgYKvSGGmF4Y3LobEgkI_J1d7Xx9SqaNo09DC-74fAistSymJgrveMCT7GgE6tQ9vp8KmAqd1aCtRhrYG92bM7K52GOv-Dtz78gWptHf8FwD95UQ</recordid><startdate>19961001</startdate><enddate>19961001</enddate><creator>Perkins, Luke T.</creator><creator>Herz, P. R.</creator><creator>Leung, K. N.</creator><creator>Pickard, D. S.</creator><scope>AAYXX</scope><scope>CITATION</scope><scope>OTOTI</scope></search><sort><creationdate>19961001</creationdate><title>Technique for the removal of electrons from an extracted, pulsed, H− ion beam</title><author>Perkins, Luke T. ; Herz, P. R. ; Leung, K. N. ; Pickard, D. S.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c323t-88fe0fe3a6d7db2459c6f946f8a8ee13595b79fddc431d75cc8d6c3bf21bd16e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1996</creationdate><topic>BEAM EXTRACTION</topic><topic>BEAM OPTICS</topic><topic>COMPUTERIZED SIMULATION</topic><topic>ELECTRONS</topic><topic>HYDROGEN 1 MINUS BEAMS</topic><topic>ION SOURCES</topic><topic>KEV RANGE</topic><topic>MAGNETIC FIELDS</topic><topic>PHYSICS</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Perkins, Luke T.</creatorcontrib><creatorcontrib>Herz, P. R.</creatorcontrib><creatorcontrib>Leung, K. N.</creatorcontrib><creatorcontrib>Pickard, D. S.</creatorcontrib><creatorcontrib>Lawrence Berkeley National Laboratory</creatorcontrib><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>Review of Scientific Instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Perkins, Luke T.</au><au>Herz, P. R.</au><au>Leung, K. N.</au><au>Pickard, D. S.</au><aucorp>Lawrence Berkeley National Laboratory</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Technique for the removal of electrons from an extracted, pulsed, H− ion beam</atitle><jtitle>Review of Scientific Instruments</jtitle><date>1996-10-01</date><risdate>1996</risdate><volume>67</volume><issue>10</issue><spage>3497</spage><epage>3500</epage><pages>3497-3500</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>A small, permanent‐magnet insert structure for the removal of electrons from pulsed, extracted, negative ion beams has been developed at Lawrence Berkeley National Laboratory. The device was computer modeled and designed for an extraction field strength of 3 kV/mm. The testing was carried out with a rf driven multicusp ion source optimized for the production of H− ions and pulsed at a few Hz with pulse widths of several hundreds of μs. It is demonstrated that the insert structure together with a collar can remove over 98% of electrons from the extracted H− ion beam without any significant deterioration of the H− ion output. Application to other negative ion beams can be expected from this magnetic collar insert.</abstract><cop>United States</cop><doi>10.1063/1.1147166</doi><tpages>4</tpages></addata></record>
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subjects BEAM EXTRACTION
BEAM OPTICS
COMPUTERIZED SIMULATION
ELECTRONS
HYDROGEN 1 MINUS BEAMS
ION SOURCES
KEV RANGE
MAGNETIC FIELDS
PHYSICS
title Technique for the removal of electrons from an extracted, pulsed, H− ion beam
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-21T02%3A20%3A35IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-scitation_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Technique%20for%20the%20removal%20of%20electrons%20from%20an%20extracted,%20pulsed,%20H%E2%88%92%20ion%20beam&rft.jtitle=Review%20of%20Scientific%20Instruments&rft.au=Perkins,%20Luke%20T.&rft.aucorp=Lawrence%20Berkeley%20National%20Laboratory&rft.date=1996-10-01&rft.volume=67&rft.issue=10&rft.spage=3497&rft.epage=3500&rft.pages=3497-3500&rft.issn=0034-6748&rft.eissn=1089-7623&rft.coden=RSINAK&rft_id=info:doi/10.1063/1.1147166&rft_dat=%3Cscitation_osti_%3Ersi%3C/scitation_osti_%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true