Resolution in surface plasmon microscopy

In this article we demonstrate how to obtain the ultimate lateral resolution in surface plasmon microscopy (SPM) (diffraction limited by the objective). Surface plasmon decay lengths are determined theoretically and experimentally, for wavelengths ranging from 531 to 676 nm, and are in good agreemen...

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Bibliographische Detailangaben

Veröffentlicht in:	Review of scientific instruments 1994-09, Vol.65 (9), p.2829-2836
Hauptverfasser:	Berger, Charles E. H., Kooyman, Rob P. H., Greve, Jan
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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