Dark‐field imaging with the scanning transmission x‐ray microscope
The King’s College London scanning transmission x‐ray microscope in use on beam line 5U2 at the SRS, SERC Daresbury Laboratory, has been modified to allow dark‐field images to be formed using only the x rays scattered by the specimen. Experiments have been performed with a number of different detect...
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| Veröffentlicht in: | Review of Scientific Instruments 1992-01, Vol.63 (1), p.611-614 |
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| container_title | Review of Scientific Instruments |
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| creator | Morrison, G. R. Browne, M. T. |
| description | The King’s College London scanning transmission x‐ray microscope in use on beam line 5U2 at the SRS, SERC Daresbury Laboratory, has been modified to allow dark‐field images to be formed using only the x rays scattered by the specimen. Experiments have been performed with a number of different detector geometries, and this has confirmed that the strongest scattering arises from edges or thickness gradients in the specimen. Although the dark‐field signal is only a small fraction of the normal transmitted bright‐field signal, features can be revealed with high contrast, and it has proved possible to detect the presence of features that are below the resolution limit of the microscope. |
| doi_str_mv | 10.1063/1.1143820 |
| format | Article |
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R.</creatorcontrib><creatorcontrib>Browne, M. T.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>Review of Scientific Instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Morrison, G. R.</au><au>Browne, M. T.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Dark‐field imaging with the scanning transmission x‐ray microscope</atitle><jtitle>Review of Scientific Instruments</jtitle><date>1992-01</date><risdate>1992</risdate><volume>63</volume><issue>1</issue><spage>611</spage><epage>614</epage><pages>611-614</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>The King’s College London scanning transmission x‐ray microscope in use on beam line 5U2 at the SRS, SERC Daresbury Laboratory, has been modified to allow dark‐field images to be formed using only the x rays scattered by the specimen. Experiments have been performed with a number of different detector geometries, and this has confirmed that the strongest scattering arises from edges or thickness gradients in the specimen. Although the dark‐field signal is only a small fraction of the normal transmitted bright‐field signal, features can be revealed with high contrast, and it has proved possible to detect the presence of features that are below the resolution limit of the microscope.</abstract><cop>Woodbury, NY</cop><pub>American Institute of Physics</pub><doi>10.1063/1.1143820</doi><tpages>4</tpages></addata></record> |
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| identifier | ISSN: 0034-6748 |
| ispartof | Review of Scientific Instruments, 1992-01, Vol.63 (1), p.611-614 |
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| language | eng |
| recordid | cdi_scitation_primary_10_1063_1_1143820 |
| source | AIP Digital Archive |
| subjects | 430303 - Particle Accelerators- Experimental Facilities & Equipment 440600 - Optical Instrumentation- (1990-) Electromagnetism electron and ion optics Exact sciences and technology Fundamental areas of phenomenology (including applications) MEASURING INSTRUMENTS MICROSCOPES OTHER INSTRUMENTATION PARTICLE ACCELERATORS Physics Radiation by moving charges RADIATION DETECTORS RADIATION SOURCES RESOLUTION SYNCHROTRON RADIATION SOURCES X-RAY EQUIPMENT |
| title | Dark‐field imaging with the scanning transmission x‐ray microscope |
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