An x‐ray image intensifier system for precision wavelength dispersive x‐ray spectroscopy
We have constructed a high‐resolution x‐ray image intensifier (XRII) for use in atomic physics. The XRII consists of an alkali halide scintillator crystal coupled by a fiber optic to a proximity focused microchannel plate stack with a bialkali photocathode and wedge and strip readout. The useful are...
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| Veröffentlicht in: | Review of scientific instruments 1990-08, Vol.61 (8), p.2121-2126 |
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| container_title | Review of scientific instruments |
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| creator | Hailey, C. J. Lupton, J. H. Siegmund, O. H. W. Stewart, R. E. Ziock, K. P. |
| description | We have constructed a high‐resolution x‐ray image intensifier (XRII) for use in atomic physics. The XRII consists of an alkali halide scintillator crystal coupled by a fiber optic to a proximity focused microchannel plate stack with a bialkali photocathode and wedge and strip readout. The useful area of the detector is 12 cm2. We have measured full width half maximum spatial resolutions at 22 keV of 300 μm and at 122 keV of 600 μm with 0.5‐mm‐thick and 1.6‐mm‐thick CsI(Na) crystals, respectively. With NaI(Tl) crystals, x‐ray arrival times can be determined with sub‐100 ns resolution. In this paper we present the detailed performance of the XRII as well as a brief discussion of the theory of photoelectron limited fast timing. |
| doi_str_mv | 10.1063/1.1141378 |
| format | Article |
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J.</creatorcontrib><creatorcontrib>Lupton, J. H.</creatorcontrib><creatorcontrib>Siegmund, O. H. W.</creatorcontrib><creatorcontrib>Stewart, R. E.</creatorcontrib><creatorcontrib>Ziock, K. P.</creatorcontrib><title>An x‐ray image intensifier system for precision wavelength dispersive x‐ray spectroscopy</title><title>Review of scientific instruments</title><description>We have constructed a high‐resolution x‐ray image intensifier (XRII) for use in atomic physics. The XRII consists of an alkali halide scintillator crystal coupled by a fiber optic to a proximity focused microchannel plate stack with a bialkali photocathode and wedge and strip readout. The useful area of the detector is 12 cm2. We have measured full width half maximum spatial resolutions at 22 keV of 300 μm and at 122 keV of 600 μm with 0.5‐mm‐thick and 1.6‐mm‐thick CsI(Na) crystals, respectively. With NaI(Tl) crystals, x‐ray arrival times can be determined with sub‐100 ns resolution. In this paper we present the detailed performance of the XRII as well as a brief discussion of the theory of photoelectron limited fast timing.</description><subject>440100 - Radiation Instrumentation</subject><subject>Exact sciences and technology</subject><subject>IMAGE INTENSIFIERS</subject><subject>INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Physics</subject><subject>RESOLUTION</subject><subject>SPATIAL RESOLUTION</subject><subject>SPECTROSCOPY</subject><subject>X- and γ-ray instruments and techniques</subject><subject>X-RAY SPECTROSCOPY</subject><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1990</creationdate><recordtype>article</recordtype><recordid>eNp9kM9KAzEQxoMoWKsH3yAIHhS2JptssnssxX9Q8KI3IWSzkzbS7i7JUt2bj-Az-iSmbLEnncvA8JtvvvkQOqdkQolgN3RCKadM5gdoREleJFKk7BCNCGE8EZLnx-gkhDcSK6N0hF6nNf74_vzyusdurReAXd1BHZx14HHoQwdrbBuPWw_GBdfU-F1vYAX1olviyoUWfHAb-BWJA9P5Jpim7U_RkdWrAGe7PkYvd7fPs4dk_nT_OJvOE8My0SUlr2RZgKl0CRlJs9LmRBNLtABOqRSaW2sJUFJVRWlBFAzyNKt4CSlPc1mwMboYdJvQORWM68AsTVPX0YoSGadcphG6GiAT3QUPVrU-fux7RYnaZqeo2mUX2cuBbXUwemW9ruPz-4WC00xIErnrgdve1F1M51_RP-FN4_egaivLfgBmEI3i</recordid><startdate>19900801</startdate><enddate>19900801</enddate><creator>Hailey, C. 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W.</creatorcontrib><creatorcontrib>Stewart, R. E.</creatorcontrib><creatorcontrib>Ziock, K. P.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Hailey, C. J.</au><au>Lupton, J. H.</au><au>Siegmund, O. H. W.</au><au>Stewart, R. E.</au><au>Ziock, K. P.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>An x‐ray image intensifier system for precision wavelength dispersive x‐ray spectroscopy</atitle><jtitle>Review of scientific instruments</jtitle><date>1990-08-01</date><risdate>1990</risdate><volume>61</volume><issue>8</issue><spage>2121</spage><epage>2126</epage><pages>2121-2126</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>We have constructed a high‐resolution x‐ray image intensifier (XRII) for use in atomic physics. The XRII consists of an alkali halide scintillator crystal coupled by a fiber optic to a proximity focused microchannel plate stack with a bialkali photocathode and wedge and strip readout. The useful area of the detector is 12 cm2. We have measured full width half maximum spatial resolutions at 22 keV of 300 μm and at 122 keV of 600 μm with 0.5‐mm‐thick and 1.6‐mm‐thick CsI(Na) crystals, respectively. With NaI(Tl) crystals, x‐ray arrival times can be determined with sub‐100 ns resolution. In this paper we present the detailed performance of the XRII as well as a brief discussion of the theory of photoelectron limited fast timing.</abstract><cop>Woodbury, NY</cop><pub>American Institute of Physics</pub><doi>10.1063/1.1141378</doi><tpages>6</tpages></addata></record> |
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| ispartof | Review of scientific instruments, 1990-08, Vol.61 (8), p.2121-2126 |
| issn | 0034-6748 1089-7623 |
| language | eng |
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| source | AIP Digital Archive |
| subjects | 440100 - Radiation Instrumentation Exact sciences and technology IMAGE INTENSIFIERS INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY Instruments, apparatus, components and techniques common to several branches of physics and astronomy Physics RESOLUTION SPATIAL RESOLUTION SPECTROSCOPY X- and γ-ray instruments and techniques X-RAY SPECTROSCOPY |
| title | An x‐ray image intensifier system for precision wavelength dispersive x‐ray spectroscopy |
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