Uniaxial wave propagation through copper mountain sandstone
Copper Mountain sandstone samples of thicknesses varying from 1.0mm to 3.6mm were tested in plane strain configuration at impact velocities from 168m/s to 529m/s. Two-dimensional (2D) images of sandstone samples, etched in a 1% Buffered Oxide Etchant (BOE), were captured with a Scanning Electron Mic...
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description | Copper Mountain sandstone samples of thicknesses varying from 1.0mm to 3.6mm were tested in plane strain configuration at impact velocities from 168m/s to 529m/s. Two-dimensional (2D) images of sandstone samples, etched in a 1% Buffered Oxide Etchant (BOE), were captured with a Scanning Electron Microscope (SEM), then used to generate three-dimensional (3D) grain size distributions. To better inform design for future pressure-shear experiments, each plane strain test contained multiple sandstone samples of varying thicknesses to compare wave formation for a given shot velocity. The particle velocity induced at the back surface of the sample was measured using Photon Doppler Velocimetry (PDV). The dynamic experiments were simulated utilizing CTH and compared with experimental results. |
doi_str_mv | 10.1063/12.0000937 |
format | Conference Proceeding |
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Matthew D.</contributor><creatorcontrib>Helminiak, Nathaniel S. ; Borg, John P. ; Zaug, Joseph ; Germann, Timothy C. ; Armstrong, Michael R. ; Wixom, Ryan ; Damm, David ; Lane, J. Matthew D.</creatorcontrib><description>Copper Mountain sandstone samples of thicknesses varying from 1.0mm to 3.6mm were tested in plane strain configuration at impact velocities from 168m/s to 529m/s. Two-dimensional (2D) images of sandstone samples, etched in a 1% Buffered Oxide Etchant (BOE), were captured with a Scanning Electron Microscope (SEM), then used to generate three-dimensional (3D) grain size distributions. To better inform design for future pressure-shear experiments, each plane strain test contained multiple sandstone samples of varying thicknesses to compare wave formation for a given shot velocity. The particle velocity induced at the back surface of the sample was measured using Photon Doppler Velocimetry (PDV). The dynamic experiments were simulated utilizing CTH and compared with experimental results.</description><identifier>ISSN: 0094-243X</identifier><identifier>EISSN: 1551-7616</identifier><identifier>DOI: 10.1063/12.0000937</identifier><identifier>CODEN: APCPCS</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Copper ; Electron microscopes ; Etchants ; Grain size distribution ; Impact velocity ; Mountains ; Plane strain ; Sandstone ; Thickness ; Velocimetry ; Wave propagation</subject><ispartof>AIP conference proceedings, 2020, Vol.2272 (1)</ispartof><rights>Author(s)</rights><rights>2020 Author(s). 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Matthew D.</contributor><creatorcontrib>Helminiak, Nathaniel S.</creatorcontrib><creatorcontrib>Borg, John P.</creatorcontrib><title>Uniaxial wave propagation through copper mountain sandstone</title><title>AIP conference proceedings</title><description>Copper Mountain sandstone samples of thicknesses varying from 1.0mm to 3.6mm were tested in plane strain configuration at impact velocities from 168m/s to 529m/s. Two-dimensional (2D) images of sandstone samples, etched in a 1% Buffered Oxide Etchant (BOE), were captured with a Scanning Electron Microscope (SEM), then used to generate three-dimensional (3D) grain size distributions. To better inform design for future pressure-shear experiments, each plane strain test contained multiple sandstone samples of varying thicknesses to compare wave formation for a given shot velocity. The particle velocity induced at the back surface of the sample was measured using Photon Doppler Velocimetry (PDV). The dynamic experiments were simulated utilizing CTH and compared with experimental results.</description><subject>Copper</subject><subject>Electron microscopes</subject><subject>Etchants</subject><subject>Grain size distribution</subject><subject>Impact velocity</subject><subject>Mountains</subject><subject>Plane strain</subject><subject>Sandstone</subject><subject>Thickness</subject><subject>Velocimetry</subject><subject>Wave propagation</subject><issn>0094-243X</issn><issn>1551-7616</issn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2020</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNp9kE1LAzEQhoMouFYv_oIFj7I1k88unqT4BQUvFryFNJttt7RJTLJV_72r7cGTcxkYnpl53xehS8BjwILeABnjoWoqj1ABnEMlBYhjVAwzVhFG307RWUprjEkt5aRAt3PX6c9Ob8oPvbNliD7opc6dd2VeRd8vV6XxIdhYbn3vsu5cmbRrUvbOnqOTVm-SvTj0EZo_3L9On6rZy-Pz9G5WBVJDrigAo7U0xjRS8AUxtWmg1Vi3mBnGFsQKTsmkNRQTENDKQT0mjdGGUN5MJB2hq_3dQd17b1NWa99HN7xUhHHJMAjOBup6TyXT5V8HKsRuq-OX2vmogKhDMio07X80YPWT5Z8N-g3yMWVU</recordid><startdate>20201102</startdate><enddate>20201102</enddate><creator>Helminiak, Nathaniel S.</creator><creator>Borg, John P.</creator><general>American Institute of Physics</general><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20201102</creationdate><title>Uniaxial wave propagation through copper mountain sandstone</title><author>Helminiak, Nathaniel S. ; Borg, John P.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p291t-3114397cccd765b2c9cd1fa0af04c44b2e65328fc302161f793702dcac235d873</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Copper</topic><topic>Electron microscopes</topic><topic>Etchants</topic><topic>Grain size distribution</topic><topic>Impact velocity</topic><topic>Mountains</topic><topic>Plane strain</topic><topic>Sandstone</topic><topic>Thickness</topic><topic>Velocimetry</topic><topic>Wave propagation</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Helminiak, Nathaniel S.</creatorcontrib><creatorcontrib>Borg, John P.</creatorcontrib><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Helminiak, Nathaniel S.</au><au>Borg, John P.</au><au>Zaug, Joseph</au><au>Germann, Timothy C.</au><au>Armstrong, Michael R.</au><au>Wixom, Ryan</au><au>Damm, David</au><au>Lane, J. Matthew D.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Uniaxial wave propagation through copper mountain sandstone</atitle><btitle>AIP conference proceedings</btitle><date>2020-11-02</date><risdate>2020</risdate><volume>2272</volume><issue>1</issue><issn>0094-243X</issn><eissn>1551-7616</eissn><coden>APCPCS</coden><abstract>Copper Mountain sandstone samples of thicknesses varying from 1.0mm to 3.6mm were tested in plane strain configuration at impact velocities from 168m/s to 529m/s. Two-dimensional (2D) images of sandstone samples, etched in a 1% Buffered Oxide Etchant (BOE), were captured with a Scanning Electron Microscope (SEM), then used to generate three-dimensional (3D) grain size distributions. To better inform design for future pressure-shear experiments, each plane strain test contained multiple sandstone samples of varying thicknesses to compare wave formation for a given shot velocity. The particle velocity induced at the back surface of the sample was measured using Photon Doppler Velocimetry (PDV). The dynamic experiments were simulated utilizing CTH and compared with experimental results.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/12.0000937</doi><tpages>7</tpages><oa>free_for_read</oa></addata></record> |
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subjects | Copper Electron microscopes Etchants Grain size distribution Impact velocity Mountains Plane strain Sandstone Thickness Velocimetry Wave propagation |
title | Uniaxial wave propagation through copper mountain sandstone |
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