An study on the depth-resolved chemical states of undoped SrTiO(001) surfaces during Ar sputtering and annealing processes with XPS

With synchrotron-based depth-resolved XPS measurements, the modification of the surface chemical states and the behavior of various impurities on undoped SrTiO 3 (001) surfaces are investigated. During the Ar + sputtering process, both the formation of oxygen vacancies in the TiO 2 layer and the for...

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Veröffentlicht in:	Journal of materials chemistry. C, Materials for optical and electronic devices Materials for optical and electronic devices, 2024-07, Vol.12 (27), p.111-1117
Hauptverfasser:	Kim, Dongwoo, Lim, Hojoon, Seo, Minsik, Shin, Hyunsuk, Kim, Kyungmin, Jang, Subin, Kim, Ki-jeong, Kim, Jeongjin, Mun, Bongjin Simon
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