Dual-emission luminescence thermometry using LaGaO:Cr, Nd phosphors
A series of La 1− x Ga 0.99 O 3 :Cr 0.01 , Nd x phosphors (where x = 0.005, 0.01, 0.02) for luminescence thermometry was synthesised by the solid-state method, structurally characterised using powder X-ray diffraction data, and investigated by ambient and variable-temperature optical measurements. T...
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Veröffentlicht in: | Journal of materials chemistry. C, Materials for optical and electronic devices Materials for optical and electronic devices, 2022-07, Vol.1 (28), p.1396-143 |
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Zusammenfassung: | A series of La
1−
x
Ga
0.99
O
3
:Cr
0.01
, Nd
x
phosphors (where
x
= 0.005, 0.01, 0.02) for luminescence thermometry was synthesised by the solid-state method, structurally characterised using powder X-ray diffraction data, and investigated by ambient and variable-temperature optical measurements. The design principle relies on the use of a combination of transition metal and rare earth activator ions such that the excitation and emission wavelengths fall within the near infra-red spectral region, notably in the 'first biological window' that is attractive for potential
in vivo
applications. The photoluminescence spectra of the compounds feature the characteristic
2
E phosphorescence of Cr
3+
at 729 nm and the
4
F
3/2
→
4
I
9/2
emission of Nd
3+
around 890 nm. The Nd
3+
emission is quenched at a higher rate than that of Cr
3+
with increasing temperature. Thermometric analysis by monitoring the luminescence intensity ratio (LIR) between the emissions of Cr
3+
and Nd
3+
from 300 K to 650 K shows a quasi-Boltzmann trend, with a maximum relative sensitivity of ∼2% K
−1
, high absolute sensitivity values over this entire temperature range, excellent temperature resolution of 0.04 K at room temperature, and high stability.
Phosphors for luminescence thermometry La
1−
x
Ga
0.99
O
3
:Cr
0.01
, Nd
x
were synthesised by the solid-state method, structurally characterised using powder X-ray diffraction data, and investigated by ambient and variable-temperature optical measurements. |
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ISSN: | 2050-7526 2050-7534 |
DOI: | 10.1039/d2tc02011d |