Dual-emission luminescence thermometry using LaGaO:Cr, Nd phosphors

A series of La 1− x Ga 0.99 O 3 :Cr 0.01 , Nd x phosphors (where x = 0.005, 0.01, 0.02) for luminescence thermometry was synthesised by the solid-state method, structurally characterised using powder X-ray diffraction data, and investigated by ambient and variable-temperature optical measurements. T...

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Veröffentlicht in:Journal of materials chemistry. C, Materials for optical and electronic devices Materials for optical and electronic devices, 2022-07, Vol.1 (28), p.1396-143
Hauptverfasser: Mullins, Abbi L, iri, Aleksandar, Zekovi, Ivana, Williams, J. A. Gareth, Drami anin, Miroslav D, Evans, Ivana Radosavljevi
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Zusammenfassung:A series of La 1− x Ga 0.99 O 3 :Cr 0.01 , Nd x phosphors (where x = 0.005, 0.01, 0.02) for luminescence thermometry was synthesised by the solid-state method, structurally characterised using powder X-ray diffraction data, and investigated by ambient and variable-temperature optical measurements. The design principle relies on the use of a combination of transition metal and rare earth activator ions such that the excitation and emission wavelengths fall within the near infra-red spectral region, notably in the 'first biological window' that is attractive for potential in vivo applications. The photoluminescence spectra of the compounds feature the characteristic 2 E phosphorescence of Cr 3+ at 729 nm and the 4 F 3/2 → 4 I 9/2 emission of Nd 3+ around 890 nm. The Nd 3+ emission is quenched at a higher rate than that of Cr 3+ with increasing temperature. Thermometric analysis by monitoring the luminescence intensity ratio (LIR) between the emissions of Cr 3+ and Nd 3+ from 300 K to 650 K shows a quasi-Boltzmann trend, with a maximum relative sensitivity of ∼2% K −1 , high absolute sensitivity values over this entire temperature range, excellent temperature resolution of 0.04 K at room temperature, and high stability. Phosphors for luminescence thermometry La 1− x Ga 0.99 O 3 :Cr 0.01 , Nd x were synthesised by the solid-state method, structurally characterised using powder X-ray diffraction data, and investigated by ambient and variable-temperature optical measurements.
ISSN:2050-7526
2050-7534
DOI:10.1039/d2tc02011d