A durable VO transition layer and defect inactivation in BiVO spontaneous valence-charge control
The performance of bismuth vanadate (BiVO 4 ) photoanodes is limited by surface defects and photo-corrosion instability. This paper proposes a revolutionary protection layer that overcomes these problems. Considering the role of V 5+ ion dissolution in photo-corrosion, we propose a surface photoelec...
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Veröffentlicht in: | Journal of materials chemistry. A, Materials for energy and sustainability Materials for energy and sustainability, 2022-10, Vol.1 (4), p.213-21314 |
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container_title | Journal of materials chemistry. A, Materials for energy and sustainability |
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creator | Kim, Dong Su Lee, Kun Woong Choi, Ji Hoon Lee, Hak Hyeon Suh, Hee Won Lee, Ho Seong Cho, Hyung Koun |
description | The performance of bismuth vanadate (BiVO
4
) photoanodes is limited by surface defects and photo-corrosion instability. This paper proposes a revolutionary protection layer that overcomes these problems. Considering the role of V
5+
ion dissolution in photo-corrosion, we propose a surface photoelectrochemical oxidation approach, artificially altering photo-corrosion to advanced photo-oxidation by strategically adding V
5+
and H
2
O
2
to the electrolyte. The surface phase transition thus induced creates an unprecedented vanadium oxide (VO
2
) photoelectrochemical protection layer that is robust, conductive, and ultrathin, while exhibiting atomic controllability. Charge-kinetic characterization of the BiVO
4
/VO
2
photoanodes revealed faster transport of interfacial charges (86%) and transfer of photogenerated carriers through the VO
2
protection layer (95%); this approach affords near-ideal performance and contributes toward high stability and extreme durability. The BiVO
4
/VO
2
/CoFeO
x
photoanodes displayed a high photocurrent density of 6.2 mA cm
−2
and an onset potential of 0.25 V
RHE
, with an applied bias photon-to-current efficiency of 2.4% at 0.62 V
RHE
.
Formation of a durable VO
2
transition protection layer and defect inactivation in BiVO
4
via
spontaneous valence-charge control. |
doi_str_mv | 10.1039/d2ta05260a |
format | Article |
fullrecord | <record><control><sourceid>rsc</sourceid><recordid>TN_cdi_rsc_primary_d2ta05260a</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>d2ta05260a</sourcerecordid><originalsourceid>FETCH-rsc_primary_d2ta05260a3</originalsourceid><addsrcrecordid>eNqFjlELAUEUhSdRhBfv6v6B5e5i7T4i8uZFXtc1ezEaM5oZyr-3STw6L9-pr1NHiF6MgxhH-bBMAuEkSZFqopXgBKPpOE_r355lTdH1_oJVMsQ0z1tiP4Py7uigGXYbCI6MV0FZA5qe7IBMCSUfWQZQhmRQD3pbZWCuqoG_WRPIsL17eJBmIzmSZ3InBlkZZ3VHNI6kPXc_bIv-arldrCPnZXFz6kruWfyej_75FxIcR10</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>A durable VO transition layer and defect inactivation in BiVO spontaneous valence-charge control</title><source>Royal Society Of Chemistry Journals 2008-</source><creator>Kim, Dong Su ; Lee, Kun Woong ; Choi, Ji Hoon ; Lee, Hak Hyeon ; Suh, Hee Won ; Lee, Ho Seong ; Cho, Hyung Koun</creator><creatorcontrib>Kim, Dong Su ; Lee, Kun Woong ; Choi, Ji Hoon ; Lee, Hak Hyeon ; Suh, Hee Won ; Lee, Ho Seong ; Cho, Hyung Koun</creatorcontrib><description>The performance of bismuth vanadate (BiVO
4
) photoanodes is limited by surface defects and photo-corrosion instability. This paper proposes a revolutionary protection layer that overcomes these problems. Considering the role of V
5+
ion dissolution in photo-corrosion, we propose a surface photoelectrochemical oxidation approach, artificially altering photo-corrosion to advanced photo-oxidation by strategically adding V
5+
and H
2
O
2
to the electrolyte. The surface phase transition thus induced creates an unprecedented vanadium oxide (VO
2
) photoelectrochemical protection layer that is robust, conductive, and ultrathin, while exhibiting atomic controllability. Charge-kinetic characterization of the BiVO
4
/VO
2
photoanodes revealed faster transport of interfacial charges (86%) and transfer of photogenerated carriers through the VO
2
protection layer (95%); this approach affords near-ideal performance and contributes toward high stability and extreme durability. The BiVO
4
/VO
2
/CoFeO
x
photoanodes displayed a high photocurrent density of 6.2 mA cm
−2
and an onset potential of 0.25 V
RHE
, with an applied bias photon-to-current efficiency of 2.4% at 0.62 V
RHE
.
Formation of a durable VO
2
transition protection layer and defect inactivation in BiVO
4
via
spontaneous valence-charge control.</description><identifier>ISSN: 2050-7488</identifier><identifier>EISSN: 2050-7496</identifier><identifier>DOI: 10.1039/d2ta05260a</identifier><ispartof>Journal of materials chemistry. A, Materials for energy and sustainability, 2022-10, Vol.1 (4), p.213-21314</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27903,27904</link.rule.ids></links><search><creatorcontrib>Kim, Dong Su</creatorcontrib><creatorcontrib>Lee, Kun Woong</creatorcontrib><creatorcontrib>Choi, Ji Hoon</creatorcontrib><creatorcontrib>Lee, Hak Hyeon</creatorcontrib><creatorcontrib>Suh, Hee Won</creatorcontrib><creatorcontrib>Lee, Ho Seong</creatorcontrib><creatorcontrib>Cho, Hyung Koun</creatorcontrib><title>A durable VO transition layer and defect inactivation in BiVO spontaneous valence-charge control</title><title>Journal of materials chemistry. A, Materials for energy and sustainability</title><description>The performance of bismuth vanadate (BiVO
4
) photoanodes is limited by surface defects and photo-corrosion instability. This paper proposes a revolutionary protection layer that overcomes these problems. Considering the role of V
5+
ion dissolution in photo-corrosion, we propose a surface photoelectrochemical oxidation approach, artificially altering photo-corrosion to advanced photo-oxidation by strategically adding V
5+
and H
2
O
2
to the electrolyte. The surface phase transition thus induced creates an unprecedented vanadium oxide (VO
2
) photoelectrochemical protection layer that is robust, conductive, and ultrathin, while exhibiting atomic controllability. Charge-kinetic characterization of the BiVO
4
/VO
2
photoanodes revealed faster transport of interfacial charges (86%) and transfer of photogenerated carriers through the VO
2
protection layer (95%); this approach affords near-ideal performance and contributes toward high stability and extreme durability. The BiVO
4
/VO
2
/CoFeO
x
photoanodes displayed a high photocurrent density of 6.2 mA cm
−2
and an onset potential of 0.25 V
RHE
, with an applied bias photon-to-current efficiency of 2.4% at 0.62 V
RHE
.
Formation of a durable VO
2
transition protection layer and defect inactivation in BiVO
4
via
spontaneous valence-charge control.</description><issn>2050-7488</issn><issn>2050-7496</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><sourceid/><recordid>eNqFjlELAUEUhSdRhBfv6v6B5e5i7T4i8uZFXtc1ezEaM5oZyr-3STw6L9-pr1NHiF6MgxhH-bBMAuEkSZFqopXgBKPpOE_r355lTdH1_oJVMsQ0z1tiP4Py7uigGXYbCI6MV0FZA5qe7IBMCSUfWQZQhmRQD3pbZWCuqoG_WRPIsL17eJBmIzmSZ3InBlkZZ3VHNI6kPXc_bIv-arldrCPnZXFz6kruWfyej_75FxIcR10</recordid><startdate>20221018</startdate><enddate>20221018</enddate><creator>Kim, Dong Su</creator><creator>Lee, Kun Woong</creator><creator>Choi, Ji Hoon</creator><creator>Lee, Hak Hyeon</creator><creator>Suh, Hee Won</creator><creator>Lee, Ho Seong</creator><creator>Cho, Hyung Koun</creator><scope/></search><sort><creationdate>20221018</creationdate><title>A durable VO transition layer and defect inactivation in BiVO spontaneous valence-charge control</title><author>Kim, Dong Su ; Lee, Kun Woong ; Choi, Ji Hoon ; Lee, Hak Hyeon ; Suh, Hee Won ; Lee, Ho Seong ; Cho, Hyung Koun</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-rsc_primary_d2ta05260a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><creationdate>2022</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kim, Dong Su</creatorcontrib><creatorcontrib>Lee, Kun Woong</creatorcontrib><creatorcontrib>Choi, Ji Hoon</creatorcontrib><creatorcontrib>Lee, Hak Hyeon</creatorcontrib><creatorcontrib>Suh, Hee Won</creatorcontrib><creatorcontrib>Lee, Ho Seong</creatorcontrib><creatorcontrib>Cho, Hyung Koun</creatorcontrib><jtitle>Journal of materials chemistry. A, Materials for energy and sustainability</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kim, Dong Su</au><au>Lee, Kun Woong</au><au>Choi, Ji Hoon</au><au>Lee, Hak Hyeon</au><au>Suh, Hee Won</au><au>Lee, Ho Seong</au><au>Cho, Hyung Koun</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A durable VO transition layer and defect inactivation in BiVO spontaneous valence-charge control</atitle><jtitle>Journal of materials chemistry. A, Materials for energy and sustainability</jtitle><date>2022-10-18</date><risdate>2022</risdate><volume>1</volume><issue>4</issue><spage>213</spage><epage>21314</epage><pages>213-21314</pages><issn>2050-7488</issn><eissn>2050-7496</eissn><abstract>The performance of bismuth vanadate (BiVO
4
) photoanodes is limited by surface defects and photo-corrosion instability. This paper proposes a revolutionary protection layer that overcomes these problems. Considering the role of V
5+
ion dissolution in photo-corrosion, we propose a surface photoelectrochemical oxidation approach, artificially altering photo-corrosion to advanced photo-oxidation by strategically adding V
5+
and H
2
O
2
to the electrolyte. The surface phase transition thus induced creates an unprecedented vanadium oxide (VO
2
) photoelectrochemical protection layer that is robust, conductive, and ultrathin, while exhibiting atomic controllability. Charge-kinetic characterization of the BiVO
4
/VO
2
photoanodes revealed faster transport of interfacial charges (86%) and transfer of photogenerated carriers through the VO
2
protection layer (95%); this approach affords near-ideal performance and contributes toward high stability and extreme durability. The BiVO
4
/VO
2
/CoFeO
x
photoanodes displayed a high photocurrent density of 6.2 mA cm
−2
and an onset potential of 0.25 V
RHE
, with an applied bias photon-to-current efficiency of 2.4% at 0.62 V
RHE
.
Formation of a durable VO
2
transition protection layer and defect inactivation in BiVO
4
via
spontaneous valence-charge control.</abstract><doi>10.1039/d2ta05260a</doi><tpages>15</tpages></addata></record> |
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identifier | ISSN: 2050-7488 |
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source | Royal Society Of Chemistry Journals 2008- |
title | A durable VO transition layer and defect inactivation in BiVO spontaneous valence-charge control |
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