Probing ballistic thermal conduction in segmented silicon nanowires

Ballistic heat conduction in semiconductors is a remarkable but controversial nanoscale phenomenon, which implies that nanostructures can conduct thermal energy without dissipation. Here, we experimentally probed ballistic thermal transport at distances of 400-800 nm and temperatures of 4-250 K. Mea...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Nanoscale 2019-07, Vol.11 (28), p.1347-13414
Hauptverfasser: Anufriev, Roman, Gluchko, Sergei, Volz, Sebastian, Nomura, Masahiro
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 13414
container_issue 28
container_start_page 1347
container_title Nanoscale
container_volume 11
creator Anufriev, Roman
Gluchko, Sergei
Volz, Sebastian
Nomura, Masahiro
description Ballistic heat conduction in semiconductors is a remarkable but controversial nanoscale phenomenon, which implies that nanostructures can conduct thermal energy without dissipation. Here, we experimentally probed ballistic thermal transport at distances of 400-800 nm and temperatures of 4-250 K. Measuring thermal properties of straight and serpentine silicon nanowires, we found that at 4 K heat conduction is quasi-ballistic with stronger ballisticity at shorter length scales. As we increased the temperature, quasi-ballistic heat conduction weakened and gradually turned into diffusive regime at temperatures above 150 K. Our Monte Carlo simulations illustrate how this transition is driven by different scattering processes and linked to the surface roughness and the temperature. These results demonstrate the length and temperature limits of quasi-ballistic heat conduction in silicon nanostructures, knowledge of which is essential for thermal management in microelectronics. We experimentally demonstrate length and temperature limits of ballistic thermal conduction in silicon nanowires.
doi_str_mv 10.1039/c9nr03863a
format Article
fullrecord <record><control><sourceid>proquest_rsc_p</sourceid><recordid>TN_cdi_rsc_primary_c9nr03863a</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2259257564</sourcerecordid><originalsourceid>FETCH-LOGICAL-c429t-53a9a5126e0e22610836e81c9358dc9f50b79ddd18cc43f9c06efdacbe1c8483</originalsourceid><addsrcrecordid>eNp90M1LwzAYBvAgipvTi3el4k2o5qtpchzFLxgqsntIk3RmtOlMWsT_3mrnvHl6X3h_PC88AJwieI0gETda-AAJZ0TtgSmGFKaE5Hh_tzM6AUcxriFkgjByCCYE4ZwhiqageAlt6fwqKVVdu9g5nXRvNjSqTnTrTa871_rE-STaVWN9Z00SXe2GW-KVbz9csPEYHFSqjvZkO2dgeXe7LB7SxfP9YzFfpJpi0aUZUUJlCDMLLcYMQU6Y5UgLknGjRZXBMhfGGMS1pqQSGjJbGaVLizSnnMzA5Ri7Ce17b2Mn120f_PBRYpwJnOUZo4O6GpUObYzBVnITXKPCp0RQftclC_H0-lPXfMDn28i-bKzZ0d9-BnAxghD17vrXt9yYajBn_xnyBaGUesY</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2259257564</pqid></control><display><type>article</type><title>Probing ballistic thermal conduction in segmented silicon nanowires</title><source>Royal Society Of Chemistry Journals 2008-</source><creator>Anufriev, Roman ; Gluchko, Sergei ; Volz, Sebastian ; Nomura, Masahiro</creator><creatorcontrib>Anufriev, Roman ; Gluchko, Sergei ; Volz, Sebastian ; Nomura, Masahiro</creatorcontrib><description>Ballistic heat conduction in semiconductors is a remarkable but controversial nanoscale phenomenon, which implies that nanostructures can conduct thermal energy without dissipation. Here, we experimentally probed ballistic thermal transport at distances of 400-800 nm and temperatures of 4-250 K. Measuring thermal properties of straight and serpentine silicon nanowires, we found that at 4 K heat conduction is quasi-ballistic with stronger ballisticity at shorter length scales. As we increased the temperature, quasi-ballistic heat conduction weakened and gradually turned into diffusive regime at temperatures above 150 K. Our Monte Carlo simulations illustrate how this transition is driven by different scattering processes and linked to the surface roughness and the temperature. These results demonstrate the length and temperature limits of quasi-ballistic heat conduction in silicon nanostructures, knowledge of which is essential for thermal management in microelectronics. We experimentally demonstrate length and temperature limits of ballistic thermal conduction in silicon nanowires.</description><identifier>ISSN: 2040-3364</identifier><identifier>EISSN: 2040-3372</identifier><identifier>DOI: 10.1039/c9nr03863a</identifier><identifier>PMID: 31276141</identifier><language>eng</language><publisher>England: Royal Society of Chemistry</publisher><subject>Computer simulation ; Conduction heating ; Conductive heat transfer ; Heat ; Nanostructure ; Nanowires ; Serpentine ; Silicon ; Surface roughness ; Temperature ; Thermal energy ; Thermal management ; Thermodynamic properties</subject><ispartof>Nanoscale, 2019-07, Vol.11 (28), p.1347-13414</ispartof><rights>Copyright Royal Society of Chemistry 2019</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c429t-53a9a5126e0e22610836e81c9358dc9f50b79ddd18cc43f9c06efdacbe1c8483</citedby><cites>FETCH-LOGICAL-c429t-53a9a5126e0e22610836e81c9358dc9f50b79ddd18cc43f9c06efdacbe1c8483</cites><orcidid>0000-0003-2069-9480 ; 0000-0003-3706-4836 ; 0000-0003-1224-0282 ; 0000-0003-2001-1033</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/31276141$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Anufriev, Roman</creatorcontrib><creatorcontrib>Gluchko, Sergei</creatorcontrib><creatorcontrib>Volz, Sebastian</creatorcontrib><creatorcontrib>Nomura, Masahiro</creatorcontrib><title>Probing ballistic thermal conduction in segmented silicon nanowires</title><title>Nanoscale</title><addtitle>Nanoscale</addtitle><description>Ballistic heat conduction in semiconductors is a remarkable but controversial nanoscale phenomenon, which implies that nanostructures can conduct thermal energy without dissipation. Here, we experimentally probed ballistic thermal transport at distances of 400-800 nm and temperatures of 4-250 K. Measuring thermal properties of straight and serpentine silicon nanowires, we found that at 4 K heat conduction is quasi-ballistic with stronger ballisticity at shorter length scales. As we increased the temperature, quasi-ballistic heat conduction weakened and gradually turned into diffusive regime at temperatures above 150 K. Our Monte Carlo simulations illustrate how this transition is driven by different scattering processes and linked to the surface roughness and the temperature. These results demonstrate the length and temperature limits of quasi-ballistic heat conduction in silicon nanostructures, knowledge of which is essential for thermal management in microelectronics. We experimentally demonstrate length and temperature limits of ballistic thermal conduction in silicon nanowires.</description><subject>Computer simulation</subject><subject>Conduction heating</subject><subject>Conductive heat transfer</subject><subject>Heat</subject><subject>Nanostructure</subject><subject>Nanowires</subject><subject>Serpentine</subject><subject>Silicon</subject><subject>Surface roughness</subject><subject>Temperature</subject><subject>Thermal energy</subject><subject>Thermal management</subject><subject>Thermodynamic properties</subject><issn>2040-3364</issn><issn>2040-3372</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNp90M1LwzAYBvAgipvTi3el4k2o5qtpchzFLxgqsntIk3RmtOlMWsT_3mrnvHl6X3h_PC88AJwieI0gETda-AAJZ0TtgSmGFKaE5Hh_tzM6AUcxriFkgjByCCYE4ZwhiqageAlt6fwqKVVdu9g5nXRvNjSqTnTrTa871_rE-STaVWN9Z00SXe2GW-KVbz9csPEYHFSqjvZkO2dgeXe7LB7SxfP9YzFfpJpi0aUZUUJlCDMLLcYMQU6Y5UgLknGjRZXBMhfGGMS1pqQSGjJbGaVLizSnnMzA5Ri7Ce17b2Mn120f_PBRYpwJnOUZo4O6GpUObYzBVnITXKPCp0RQftclC_H0-lPXfMDn28i-bKzZ0d9-BnAxghD17vrXt9yYajBn_xnyBaGUesY</recordid><startdate>20190728</startdate><enddate>20190728</enddate><creator>Anufriev, Roman</creator><creator>Gluchko, Sergei</creator><creator>Volz, Sebastian</creator><creator>Nomura, Masahiro</creator><general>Royal Society of Chemistry</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>JG9</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0003-2069-9480</orcidid><orcidid>https://orcid.org/0000-0003-3706-4836</orcidid><orcidid>https://orcid.org/0000-0003-1224-0282</orcidid><orcidid>https://orcid.org/0000-0003-2001-1033</orcidid></search><sort><creationdate>20190728</creationdate><title>Probing ballistic thermal conduction in segmented silicon nanowires</title><author>Anufriev, Roman ; Gluchko, Sergei ; Volz, Sebastian ; Nomura, Masahiro</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c429t-53a9a5126e0e22610836e81c9358dc9f50b79ddd18cc43f9c06efdacbe1c8483</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Computer simulation</topic><topic>Conduction heating</topic><topic>Conductive heat transfer</topic><topic>Heat</topic><topic>Nanostructure</topic><topic>Nanowires</topic><topic>Serpentine</topic><topic>Silicon</topic><topic>Surface roughness</topic><topic>Temperature</topic><topic>Thermal energy</topic><topic>Thermal management</topic><topic>Thermodynamic properties</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Anufriev, Roman</creatorcontrib><creatorcontrib>Gluchko, Sergei</creatorcontrib><creatorcontrib>Volz, Sebastian</creatorcontrib><creatorcontrib>Nomura, Masahiro</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Nanoscale</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Anufriev, Roman</au><au>Gluchko, Sergei</au><au>Volz, Sebastian</au><au>Nomura, Masahiro</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Probing ballistic thermal conduction in segmented silicon nanowires</atitle><jtitle>Nanoscale</jtitle><addtitle>Nanoscale</addtitle><date>2019-07-28</date><risdate>2019</risdate><volume>11</volume><issue>28</issue><spage>1347</spage><epage>13414</epage><pages>1347-13414</pages><issn>2040-3364</issn><eissn>2040-3372</eissn><abstract>Ballistic heat conduction in semiconductors is a remarkable but controversial nanoscale phenomenon, which implies that nanostructures can conduct thermal energy without dissipation. Here, we experimentally probed ballistic thermal transport at distances of 400-800 nm and temperatures of 4-250 K. Measuring thermal properties of straight and serpentine silicon nanowires, we found that at 4 K heat conduction is quasi-ballistic with stronger ballisticity at shorter length scales. As we increased the temperature, quasi-ballistic heat conduction weakened and gradually turned into diffusive regime at temperatures above 150 K. Our Monte Carlo simulations illustrate how this transition is driven by different scattering processes and linked to the surface roughness and the temperature. These results demonstrate the length and temperature limits of quasi-ballistic heat conduction in silicon nanostructures, knowledge of which is essential for thermal management in microelectronics. We experimentally demonstrate length and temperature limits of ballistic thermal conduction in silicon nanowires.</abstract><cop>England</cop><pub>Royal Society of Chemistry</pub><pmid>31276141</pmid><doi>10.1039/c9nr03863a</doi><tpages>8</tpages><orcidid>https://orcid.org/0000-0003-2069-9480</orcidid><orcidid>https://orcid.org/0000-0003-3706-4836</orcidid><orcidid>https://orcid.org/0000-0003-1224-0282</orcidid><orcidid>https://orcid.org/0000-0003-2001-1033</orcidid></addata></record>
fulltext fulltext
identifier ISSN: 2040-3364
ispartof Nanoscale, 2019-07, Vol.11 (28), p.1347-13414
issn 2040-3364
2040-3372
language eng
recordid cdi_rsc_primary_c9nr03863a
source Royal Society Of Chemistry Journals 2008-
subjects Computer simulation
Conduction heating
Conductive heat transfer
Heat
Nanostructure
Nanowires
Serpentine
Silicon
Surface roughness
Temperature
Thermal energy
Thermal management
Thermodynamic properties
title Probing ballistic thermal conduction in segmented silicon nanowires
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-21T19%3A12%3A36IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_rsc_p&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Probing%20ballistic%20thermal%20conduction%20in%20segmented%20silicon%20nanowires&rft.jtitle=Nanoscale&rft.au=Anufriev,%20Roman&rft.date=2019-07-28&rft.volume=11&rft.issue=28&rft.spage=1347&rft.epage=13414&rft.pages=1347-13414&rft.issn=2040-3364&rft.eissn=2040-3372&rft_id=info:doi/10.1039/c9nr03863a&rft_dat=%3Cproquest_rsc_p%3E2259257564%3C/proquest_rsc_p%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2259257564&rft_id=info:pmid/31276141&rfr_iscdi=true