Ellipsometric study of the complex optical constants of a CsPbBr3 perovskite thin film

Knowledge of the complex optical constants of the hybrid perovskite CsPbBr 3 in thin films is essential for their applications in optoelectronic devices. In this paper, we measured the optical constants of a perovskite CsPbBr 3 thin film deposited on an FTO substrate. We characterized the CsPbBr 3 t...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Journal of materials chemistry. C, Materials for optical and electronic devices Materials for optical and electronic devices, 2018, Vol.6 (39), p.145-1455
Hauptverfasser:	Zhao, Minglin, Shi, Yujun, Dai, Jun, Lian, Jie
Format:	Artikel
Sprache:	eng
Schlagworte:	Absorption spectra Absorptivity Atomic force microscopy Cesium ions Computer simulation Critical point Optoelectronic devices Oscillators Perovskites Photoluminescence Scanning electron microscopy Spectroellipsometry Substrates Thin films X-ray diffraction
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!