Control of crystal growth and thermoelectric properties of sputter-deposited BiTe thin films embedded with alumina nanoparticlesElectronic supplementary information (ESI) available: FESEM, XRD and XPS spectra of films. See DOI: 10.1039/c6ce02191c

BiTe thin films embedded with alumina nanoparticles were prepared by co-sputtering Al and Bi 2 Te 3 targets at 300 °C. The Al content in the films was determined by varying the applied power of the Al target. Al transformed into alumina by oxygen contamination during deposition, and alumina nanopart...

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Hauptverfasser:	Kim, Byeong Geun, Son, Geonsik, Choi, Soon-Mok
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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