Volume dependence of the dielectric properties of amorphous SiO2Electronic supplementary information (ESI) available. See DOI: 10.1039/c5cp06775h

Using first principles calculations, the analysis of the dielectric properties of amorphous SiO 2 (am-SiO 2 ) was performed. We found that the am-SiO 2 properties are volume dependent, and the dependence is mainly induced by the variation of nanoporosity at the atomic scale. In particular, both ioni...

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Hauptverfasser:	Malyi, Oleksandr I, Boström, Mathias, Kulish, Vadym V, Thiyam, Priyadarshini, Parsons, Drew F, Persson, Clas
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