Diffraction topography using white X-ray beams with low effective divergence

The divergence of the incident X-ray beam as seen from a point in the specimen, the effective divergence α, is of the order of a microradian at a third generation synchrotron radiation source. This entails two effects on white- beam X-ray diffraction topography. 1. The specimen-detector distance can...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Philosophical transactions of the Royal Society of London. Series A: Mathematical, physical, and engineering sciences physical, and engineering sciences, 1999-10, Vol.357 (1761), p.2741-2754
Hauptverfasser:	Baruchel, José, Cloetens, Peter, Härtwig, Jürgen, Schlenker, Michel
Format:	Artikel
Sprache:	eng
Schlagworte:	Bragg-Diffraction Imaging Crystal lattices Crystallographic Phase Determination Crystals Electric fields Imaging Magnetic fields Magnetite Optical Coherence Semiconductor wafers Synchrotron Radiation Synchrotrons Wave diffraction X-Ray Imaging X-Ray Topography
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!