InGaAs/InAlAs single photon avalanche diode for 1550 nm photons

A single photon avalanche diode (SPAD) with an InGaAs absorption region, and an InAlAs avalanche region was designed and demonstrated to detect 1550 nm wavelength photons. The characterization included leakage current, dark count rate and single photon detection efficiency as functions of temperatur...

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Veröffentlicht in:Royal Society open science 2016-03, Vol.3 (3), p.150584-150584
Hauptverfasser: Meng, Xiao, Xie, Shiyu, Zhou, Xinxin, Calandri, Niccolò, Sanzaro, Mirko, Tosi, Alberto, Tan, Chee Hing, Ng, Jo Shien
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container_end_page 150584
container_issue 3
container_start_page 150584
container_title Royal Society open science
container_volume 3
creator Meng, Xiao
Xie, Shiyu
Zhou, Xinxin
Calandri, Niccolò
Sanzaro, Mirko
Tosi, Alberto
Tan, Chee Hing
Ng, Jo Shien
description A single photon avalanche diode (SPAD) with an InGaAs absorption region, and an InAlAs avalanche region was designed and demonstrated to detect 1550 nm wavelength photons. The characterization included leakage current, dark count rate and single photon detection efficiency as functions of temperature from 210 to 294 K. The SPAD exhibited good temperature stability, with breakdown voltage dependence of approximately 45 mV K−1. Operating at 210 K and in a gated mode, the SPAD achieved a photon detection probability of 26% at 1550 nm with a dark count rate of 1 × 108 Hz. The time response of the SPAD showed decreasing timing jitter (full width at half maximum) with increasing overbias voltage, with 70 ps being the smallest timing jitter measured.
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subjects Engineering
Fibre-Optic Telecommunication
Photon Counting
Research Article
Single Photon Avalanche Diode
title InGaAs/InAlAs single photon avalanche diode for 1550 nm photons
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