Putting High-Index Cu on the Map for High-Yield, Dry-Transferred CVD Graphene

Reliable, clean transfer and interfacing of 2D material layers are technologically as important as their growth. Bringing both together remains a challenge due to the vast, interconnected parameter space. We introduce a fast-screening descriptor approach to demonstrate holistic data-driven optimizat...

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Veröffentlicht in:	ACS nano 2023-01, Vol.17 (2), p.1229-1238
Hauptverfasser:	Burton, Oliver J., Winter, Zachary, Watanabe, Kenji, Taniguchi, Takashi, Beschoten, Bernd, Stampfer, Christoph, Hofmann, Stephan
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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