Active line scan with spatial gating for sub-diffuse reflectance imaging of scatter microtexture

We examine the value of an active line scan with spatial gating for imaging sub-diffuse, wide-field reflectance microtexture. Line scanning combined with spatial gating and linear translation can be used for localized detection of features in the surface layer of a turbid target. The line scan provi...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Optics letters 2020-12, Vol.45 (23), p.6378-6381
Hauptverfasser:	Streeter, Samuel S, Maloney, Benjamin W, Paulsen, Keith D, Pogue, Brian W
Format:	Artikel
Sprache:	eng
Schlagworte:	Broadband Dynamic range Field of view Frequency modulation High pass filters Imaging Microtexture Reflectance Scanning Surface layers
Online-Zugang:	Volltext
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