Investigation of annealing effects on the physical properties of Ni0.6Zn0.4Fe1.5Al0.5O4 ferrite

In the present study, the structural, morphological, electrical, and dielectric properties of Ni0.6Zn0.4Fe1.5Al0.5O4 annealed at 600 °C, 900 °C, and 1200 °C were investigated. The X-ray diffraction patterns confirmed the presence of the single-phase cubic spinel structure with the Fd3m space group....

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Veröffentlicht in:	RSC advances 2019, Vol.9 (35), p.19949-19964
Hauptverfasser:	Lahouli, R, Massoudi, J, Smari, M, Rahmouni, H, Khirouni, K, Dhahri, E, Bessais, L
Format:	Artikel
Sprache:	eng
Schlagworte:	Annealing Chemistry Circuits Dielectric properties Diffraction patterns Electrical resistivity Grain boundaries Investigations Nanoparticles Nyquist plots Physical properties Temperature X-ray diffraction
Online-Zugang:	Volltext
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