Mitigating background caused by extraneous scattering in small‐angle neutron scattering instrument design
Measurements, calculations and design ideas to mitigate background caused by extraneous scattering in small‐angle neutron scattering (SANS) instruments are presented. Scattering includes processes such as incoherent scattering, inelastic scattering and Bragg diffraction. Three primary sources of thi...
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| Veröffentlicht in: | Journal of applied crystallography 2021-04, Vol.54 (2), p.461-472 |
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| container_title | Journal of applied crystallography |
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| creator | Barker, John George Cook, Jeremy C. Chabot, Jean Philippe Kline, Steven R. Zhang, Zhenhuan Gagnon, Cedric |
| description | Measurements, calculations and design ideas to mitigate background caused by extraneous scattering in small‐angle neutron scattering (SANS) instruments are presented. Scattering includes processes such as incoherent scattering, inelastic scattering and Bragg diffraction. Three primary sources of this type of background are investigated: the beam stop located in front of the detector, the inside lining of the detector vessel and the environment surrounding the sample. SANS measurements were made where materials with different albedos were placed in all three locations. Additional measurements of the angle‐dependent scattering over the angular range of 0.7π–0.95π rad were completed on 16 different shielding materials at five wavelengths. The data were extrapolated to cover scattering angles from π/2 to π rad in order to estimate the materials' albedos. Modifications to existing SANS instruments and sample environments to mitigate extraneous scattering from surfaces are discussed.
Measurements and methods of mitigation for small‐angle neutron scattering instrument background caused by extraneous scattering from surfaces are presented. |
| doi_str_mv | 10.1107/S1600576721001084 |
| format | Article |
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Measurements and methods of mitigation for small‐angle neutron scattering instrument background caused by extraneous scattering from surfaces are presented.</description><identifier>ISSN: 1600-5767</identifier><identifier>ISSN: 0021-8898</identifier><identifier>EISSN: 1600-5767</identifier><identifier>DOI: 10.1107/S1600576721001084</identifier><identifier>PMID: 33953652</identifier><language>eng</language><publisher>5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography</publisher><subject>albedo ; background ; extraneous scattering ; Incoherent scattering ; Inelastic scattering ; Neutron scattering ; Neutrons ; Research Papers ; SANS ; Scattering angle ; Shielding ; small‐angle neutron scattering ; Wavelengths</subject><ispartof>Journal of applied crystallography, 2021-04, Vol.54 (2), p.461-472</ispartof><rights>2021 J. G. Barker et al. published by IUCr Journals.</rights><rights>J. G. Barker et al. 2021.</rights><rights>2021. This article is published under http://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><rights>J. G. Barker et al. 2021 2021</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c4779-6d033b8933459f8e8c5a72d9c446676e6aef4fd286c9062a10d6c2bc11ed976b3</citedby><cites>FETCH-LOGICAL-c4779-6d033b8933459f8e8c5a72d9c446676e6aef4fd286c9062a10d6c2bc11ed976b3</cites><orcidid>0000-0002-6348-1812</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1107%2FS1600576721001084$$EPDF$$P50$$Gwiley$$Hfree_for_read</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1107%2FS1600576721001084$$EHTML$$P50$$Gwiley$$Hfree_for_read</linktohtml><link.rule.ids>230,314,776,780,881,1411,27901,27902,45550,45551</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/33953652$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Barker, John George</creatorcontrib><creatorcontrib>Cook, Jeremy C.</creatorcontrib><creatorcontrib>Chabot, Jean Philippe</creatorcontrib><creatorcontrib>Kline, Steven R.</creatorcontrib><creatorcontrib>Zhang, Zhenhuan</creatorcontrib><creatorcontrib>Gagnon, Cedric</creatorcontrib><title>Mitigating background caused by extraneous scattering in small‐angle neutron scattering instrument design</title><title>Journal of applied crystallography</title><addtitle>J Appl Crystallogr</addtitle><description>Measurements, calculations and design ideas to mitigate background caused by extraneous scattering in small‐angle neutron scattering (SANS) instruments are presented. Scattering includes processes such as incoherent scattering, inelastic scattering and Bragg diffraction. Three primary sources of this type of background are investigated: the beam stop located in front of the detector, the inside lining of the detector vessel and the environment surrounding the sample. SANS measurements were made where materials with different albedos were placed in all three locations. Additional measurements of the angle‐dependent scattering over the angular range of 0.7π–0.95π rad were completed on 16 different shielding materials at five wavelengths. The data were extrapolated to cover scattering angles from π/2 to π rad in order to estimate the materials' albedos. Modifications to existing SANS instruments and sample environments to mitigate extraneous scattering from surfaces are discussed.
Measurements and methods of mitigation for small‐angle neutron scattering instrument background caused by extraneous scattering from surfaces are presented.</description><subject>albedo</subject><subject>background</subject><subject>extraneous scattering</subject><subject>Incoherent scattering</subject><subject>Inelastic scattering</subject><subject>Neutron scattering</subject><subject>Neutrons</subject><subject>Research Papers</subject><subject>SANS</subject><subject>Scattering angle</subject><subject>Shielding</subject><subject>small‐angle neutron scattering</subject><subject>Wavelengths</subject><issn>1600-5767</issn><issn>0021-8898</issn><issn>1600-5767</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><sourceid>24P</sourceid><recordid>eNqFkctO3TAQhq0KVC7tA3SDIrHp5oAviR1vkKqjtoC4SL2sLceeBEPiUNtpe3Y8As_Ik-CjQxHQBasZjb_5Z8Y_Qh8I3iMEi_3vhGNcCS4owZjgunyDNpel2bK29iTfQFsxXmYmo_Qt2mBMVoxXdBNdnbrkOp2c74pGm6sujJO3hdFTBFs0iwL-pqA9jFMsotEpQViizhdx0H1_d3OrfddD4WFKYfTPmZjCNIBPhYXoOv8Orbe6j_D-IW6jn18-_5gfzk7Ovx7NP53MTCmEnHGLGWtqyVhZybaG2lRaUCtNWXIuOHANbdlaWnMjMaeaYMsNbQwhYKXgDdtGByvd66kZwJq8QdC9ug5u0GGhRu3U8xfvLlQ3_lY1rvIAkgU-PgiE8dcEManBRQN9v_oIRStKOeGZzOjuC_RynILP52UKS0ooISJTZEWZMMYYoH1chmC1tFL9Z2Xu2Xl6xWPHP-8yIFfAH9fD4nVFdTz_Ro_OKlxKdg_jQKzV</recordid><startdate>202104</startdate><enddate>202104</enddate><creator>Barker, John George</creator><creator>Cook, Jeremy C.</creator><creator>Chabot, Jean Philippe</creator><creator>Kline, Steven R.</creator><creator>Zhang, Zhenhuan</creator><creator>Gagnon, Cedric</creator><general>International Union of Crystallography</general><general>Blackwell Publishing Ltd</general><scope>24P</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope><scope>7X8</scope><scope>5PM</scope><orcidid>https://orcid.org/0000-0002-6348-1812</orcidid></search><sort><creationdate>202104</creationdate><title>Mitigating background caused by extraneous scattering in small‐angle neutron scattering instrument design</title><author>Barker, John George ; Cook, Jeremy C. ; Chabot, Jean Philippe ; Kline, Steven R. ; Zhang, Zhenhuan ; Gagnon, Cedric</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4779-6d033b8933459f8e8c5a72d9c446676e6aef4fd286c9062a10d6c2bc11ed976b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>albedo</topic><topic>background</topic><topic>extraneous scattering</topic><topic>Incoherent scattering</topic><topic>Inelastic scattering</topic><topic>Neutron scattering</topic><topic>Neutrons</topic><topic>Research Papers</topic><topic>SANS</topic><topic>Scattering angle</topic><topic>Shielding</topic><topic>small‐angle neutron scattering</topic><topic>Wavelengths</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Barker, John George</creatorcontrib><creatorcontrib>Cook, Jeremy C.</creatorcontrib><creatorcontrib>Chabot, Jean Philippe</creatorcontrib><creatorcontrib>Kline, Steven R.</creatorcontrib><creatorcontrib>Zhang, Zhenhuan</creatorcontrib><creatorcontrib>Gagnon, Cedric</creatorcontrib><collection>Wiley Online Library Open Access</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>MEDLINE - Academic</collection><collection>PubMed Central (Full Participant titles)</collection><jtitle>Journal of applied crystallography</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Barker, John George</au><au>Cook, Jeremy C.</au><au>Chabot, Jean Philippe</au><au>Kline, Steven R.</au><au>Zhang, Zhenhuan</au><au>Gagnon, Cedric</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Mitigating background caused by extraneous scattering in small‐angle neutron scattering instrument design</atitle><jtitle>Journal of applied crystallography</jtitle><addtitle>J Appl Crystallogr</addtitle><date>2021-04</date><risdate>2021</risdate><volume>54</volume><issue>2</issue><spage>461</spage><epage>472</epage><pages>461-472</pages><issn>1600-5767</issn><issn>0021-8898</issn><eissn>1600-5767</eissn><abstract>Measurements, calculations and design ideas to mitigate background caused by extraneous scattering in small‐angle neutron scattering (SANS) instruments are presented. Scattering includes processes such as incoherent scattering, inelastic scattering and Bragg diffraction. Three primary sources of this type of background are investigated: the beam stop located in front of the detector, the inside lining of the detector vessel and the environment surrounding the sample. SANS measurements were made where materials with different albedos were placed in all three locations. Additional measurements of the angle‐dependent scattering over the angular range of 0.7π–0.95π rad were completed on 16 different shielding materials at five wavelengths. The data were extrapolated to cover scattering angles from π/2 to π rad in order to estimate the materials' albedos. Modifications to existing SANS instruments and sample environments to mitigate extraneous scattering from surfaces are discussed.
Measurements and methods of mitigation for small‐angle neutron scattering instrument background caused by extraneous scattering from surfaces are presented.</abstract><cop>5 Abbey Square, Chester, Cheshire CH1 2HU, England</cop><pub>International Union of Crystallography</pub><pmid>33953652</pmid><doi>10.1107/S1600576721001084</doi><tpages>12</tpages><orcidid>https://orcid.org/0000-0002-6348-1812</orcidid><oa>free_for_read</oa></addata></record> |
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| subjects | albedo background extraneous scattering Incoherent scattering Inelastic scattering Neutron scattering Neutrons Research Papers SANS Scattering angle Shielding small‐angle neutron scattering Wavelengths |
| title | Mitigating background caused by extraneous scattering in small‐angle neutron scattering instrument design |
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