Influence of plasmon excitations on atomic-resolution quantitative 4D scanning transmission electron microscopy

Scanning transmission electron microscopy (STEM) allows to gain quantitative information on the atomic-scale structure and composition of materials, satisfying one of todays major needs in the development of novel nanoscale devices. The aim of this study is to quantify the impact of inelastic, i.e....

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Scientific reports 2020-10, Vol.10 (1), p.17890-17890, Article 17890
Hauptverfasser:	Beyer, Andreas, Krause, Florian F., Robert, Hoel L., Firoozabadi, Saleh, Grieb, Tim, Kükelhan, Pirmin, Heimes, Damien, Schowalter, Marco, Müller-Caspary, Knut, Rosenauer, Andreas, Volz, Kerstin
Format:	Artikel
Sprache:	eng
Schlagworte:	639/301 639/766 639/925 Energy Humanities and Social Sciences Microscopes multidisciplinary Platinum Science Science (multidisciplinary) Simulation Transmission electron microscopy
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!