Graphene as a Schottky Barrier Contact to AlGaN/GaN Heterostructures
Electrical and noise properties of graphene contacts to AlGaN/GaN heterostructures were studied experimentally. It was found that graphene on AlGaN forms a high-quality Schottky barrier with the barrier height dependent on the bias. The apparent barrier heights for this kind of Schottky diode were f...
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Veröffentlicht in: | Materials 2020-09, Vol.13 (18), p.4140 |
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creator | Dub, Maksym Sai, Pavlo Przewłoka, Aleksandra Krajewska, Aleksandra Sakowicz, Maciej Prystawko, Paweł Kacperski, Jacek Pasternak, Iwona Cywiński, Grzegorz But, Dmytro Knap, Wojciech Rumyantsev, Sergey |
description | Electrical and noise properties of graphene contacts to AlGaN/GaN heterostructures were studied experimentally. It was found that graphene on AlGaN forms a high-quality Schottky barrier with the barrier height dependent on the bias. The apparent barrier heights for this kind of Schottky diode were found to be relatively high, varying within the range of φb = (1.0–1.26) eV. AlGaN/GaN fin-shaped field-effect transistors (finFETs) with a graphene gate were fabricated and studied. These devices demonstrated ~8 order of magnitude on/off ratio, subthreshold slope of ~1.3, and low subthreshold current in the sub-picoamperes range. The effective trap density responsible for the 1/f low-frequency noise was found within the range of (1–5) · 1019 eV−1 cm−3. These values are of the same order of magnitude as reported earlier and in AlGaN/GaN transistors with Ni/Au Schottky gate studied as a reference in the current study. A good quality of graphene/AlGaN Schottky barrier diodes and AlGaN/GaN transistors opens the way for transparent GaN-based electronics and GaN-based devices exploring vertical electron transport in graphene. |
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It was found that graphene on AlGaN forms a high-quality Schottky barrier with the barrier height dependent on the bias. The apparent barrier heights for this kind of Schottky diode were found to be relatively high, varying within the range of φb = (1.0–1.26) eV. AlGaN/GaN fin-shaped field-effect transistors (finFETs) with a graphene gate were fabricated and studied. These devices demonstrated ~8 order of magnitude on/off ratio, subthreshold slope of ~1.3, and low subthreshold current in the sub-picoamperes range. The effective trap density responsible for the 1/f low-frequency noise was found within the range of (1–5) · 1019 eV−1 cm−3. These values are of the same order of magnitude as reported earlier and in AlGaN/GaN transistors with Ni/Au Schottky gate studied as a reference in the current study. A good quality of graphene/AlGaN Schottky barrier diodes and AlGaN/GaN transistors opens the way for transparent GaN-based electronics and GaN-based devices exploring vertical electron transport in graphene.</description><identifier>ISSN: 1996-1944</identifier><identifier>EISSN: 1996-1944</identifier><identifier>DOI: 10.3390/ma13184140</identifier><identifier>PMID: 32957632</identifier><language>eng</language><publisher>MDPI</publisher><subject>Physics</subject><ispartof>Materials, 2020-09, Vol.13 (18), p.4140</ispartof><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><rights>2020 by the authors. 2020</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c389t-ebdae566b53da38ded10a8efc3fca2f3ce547b43035193fe431f028e01f494c03</citedby><cites>FETCH-LOGICAL-c389t-ebdae566b53da38ded10a8efc3fca2f3ce547b43035193fe431f028e01f494c03</cites><orcidid>0000-0001-6616-2932 ; 0000-0003-0762-5639 ; 0000-0002-6143-9469 ; 0000-0002-8308-4187 ; 0000-0002-3143-5491 ; 0000-0002-0735-4608 ; 0000-0002-3393-4593 ; 0000-0002-6898-4638 ; 0000-0003-3616-8756</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://www.ncbi.nlm.nih.gov/pmc/articles/PMC7560388/pdf/$$EPDF$$P50$$Gpubmedcentral$$Hfree_for_read</linktopdf><linktohtml>$$Uhttps://www.ncbi.nlm.nih.gov/pmc/articles/PMC7560388/$$EHTML$$P50$$Gpubmedcentral$$Hfree_for_read</linktohtml><link.rule.ids>230,314,723,776,780,881,27901,27902,53766,53768</link.rule.ids><backlink>$$Uhttps://cnrs.hal.science/hal-04840406$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Dub, Maksym</creatorcontrib><creatorcontrib>Sai, Pavlo</creatorcontrib><creatorcontrib>Przewłoka, Aleksandra</creatorcontrib><creatorcontrib>Krajewska, Aleksandra</creatorcontrib><creatorcontrib>Sakowicz, Maciej</creatorcontrib><creatorcontrib>Prystawko, Paweł</creatorcontrib><creatorcontrib>Kacperski, Jacek</creatorcontrib><creatorcontrib>Pasternak, Iwona</creatorcontrib><creatorcontrib>Cywiński, Grzegorz</creatorcontrib><creatorcontrib>But, Dmytro</creatorcontrib><creatorcontrib>Knap, Wojciech</creatorcontrib><creatorcontrib>Rumyantsev, Sergey</creatorcontrib><title>Graphene as a Schottky Barrier Contact to AlGaN/GaN Heterostructures</title><title>Materials</title><description>Electrical and noise properties of graphene contacts to AlGaN/GaN heterostructures were studied experimentally. It was found that graphene on AlGaN forms a high-quality Schottky barrier with the barrier height dependent on the bias. The apparent barrier heights for this kind of Schottky diode were found to be relatively high, varying within the range of φb = (1.0–1.26) eV. AlGaN/GaN fin-shaped field-effect transistors (finFETs) with a graphene gate were fabricated and studied. These devices demonstrated ~8 order of magnitude on/off ratio, subthreshold slope of ~1.3, and low subthreshold current in the sub-picoamperes range. The effective trap density responsible for the 1/f low-frequency noise was found within the range of (1–5) · 1019 eV−1 cm−3. These values are of the same order of magnitude as reported earlier and in AlGaN/GaN transistors with Ni/Au Schottky gate studied as a reference in the current study. A good quality of graphene/AlGaN Schottky barrier diodes and AlGaN/GaN transistors opens the way for transparent GaN-based electronics and GaN-based devices exploring vertical electron transport in graphene.</description><subject>Physics</subject><issn>1996-1944</issn><issn>1996-1944</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><recordid>eNpdkU1PwzAMhiMEYmjswi_oEZDKkjptkwvSGLAhTXAAzlGaurTQtSNJJ-3f02kTX5YsW_brx5JNyBmjVwCSjpeaAROccXpATpiUScgk54e_8gEZOfdOe4NeGcljMoBIxmkC0Qm5nVm9KrHBQLtAB8-mbL3_2AQ32toKbTBtG6-ND3wbTOqZfhz3HszRo22dt53xnUV3So4KXTsc7eOQvN7fvUzn4eJp9jCdLEIDQvoQs1xjnCRZDLkGkWPOqBZYGCiMjgowGPM040AhZhIK5MAKGgmkrOCSGwpDcr3jrrpsibnBxltdq5WtltpuVKsr9bfTVKV6a9cqjRMKQvSAix2g_Dc2nyzUtka54JTTZM167fl-mW0_O3ReLStnsK51g23nVMQ5F2mcyriXXu6kpr-Ks1h8sxlV2y-pny_BF76QgoE</recordid><startdate>20200917</startdate><enddate>20200917</enddate><creator>Dub, Maksym</creator><creator>Sai, Pavlo</creator><creator>Przewłoka, Aleksandra</creator><creator>Krajewska, Aleksandra</creator><creator>Sakowicz, Maciej</creator><creator>Prystawko, Paweł</creator><creator>Kacperski, Jacek</creator><creator>Pasternak, Iwona</creator><creator>Cywiński, Grzegorz</creator><creator>But, Dmytro</creator><creator>Knap, Wojciech</creator><creator>Rumyantsev, Sergey</creator><general>MDPI</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><scope>1XC</scope><scope>5PM</scope><orcidid>https://orcid.org/0000-0001-6616-2932</orcidid><orcidid>https://orcid.org/0000-0003-0762-5639</orcidid><orcidid>https://orcid.org/0000-0002-6143-9469</orcidid><orcidid>https://orcid.org/0000-0002-8308-4187</orcidid><orcidid>https://orcid.org/0000-0002-3143-5491</orcidid><orcidid>https://orcid.org/0000-0002-0735-4608</orcidid><orcidid>https://orcid.org/0000-0002-3393-4593</orcidid><orcidid>https://orcid.org/0000-0002-6898-4638</orcidid><orcidid>https://orcid.org/0000-0003-3616-8756</orcidid></search><sort><creationdate>20200917</creationdate><title>Graphene as a Schottky Barrier Contact to AlGaN/GaN Heterostructures</title><author>Dub, Maksym ; Sai, Pavlo ; Przewłoka, Aleksandra ; Krajewska, Aleksandra ; Sakowicz, Maciej ; Prystawko, Paweł ; Kacperski, Jacek ; Pasternak, Iwona ; Cywiński, Grzegorz ; But, Dmytro ; Knap, Wojciech ; Rumyantsev, Sergey</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c389t-ebdae566b53da38ded10a8efc3fca2f3ce547b43035193fe431f028e01f494c03</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Physics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Dub, Maksym</creatorcontrib><creatorcontrib>Sai, Pavlo</creatorcontrib><creatorcontrib>Przewłoka, Aleksandra</creatorcontrib><creatorcontrib>Krajewska, Aleksandra</creatorcontrib><creatorcontrib>Sakowicz, Maciej</creatorcontrib><creatorcontrib>Prystawko, Paweł</creatorcontrib><creatorcontrib>Kacperski, Jacek</creatorcontrib><creatorcontrib>Pasternak, Iwona</creatorcontrib><creatorcontrib>Cywiński, Grzegorz</creatorcontrib><creatorcontrib>But, Dmytro</creatorcontrib><creatorcontrib>Knap, Wojciech</creatorcontrib><creatorcontrib>Rumyantsev, Sergey</creatorcontrib><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>Hyper Article en Ligne (HAL)</collection><collection>PubMed Central (Full Participant titles)</collection><jtitle>Materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Dub, Maksym</au><au>Sai, Pavlo</au><au>Przewłoka, Aleksandra</au><au>Krajewska, Aleksandra</au><au>Sakowicz, Maciej</au><au>Prystawko, Paweł</au><au>Kacperski, Jacek</au><au>Pasternak, Iwona</au><au>Cywiński, Grzegorz</au><au>But, Dmytro</au><au>Knap, Wojciech</au><au>Rumyantsev, Sergey</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Graphene as a Schottky Barrier Contact to AlGaN/GaN Heterostructures</atitle><jtitle>Materials</jtitle><date>2020-09-17</date><risdate>2020</risdate><volume>13</volume><issue>18</issue><spage>4140</spage><pages>4140-</pages><issn>1996-1944</issn><eissn>1996-1944</eissn><abstract>Electrical and noise properties of graphene contacts to AlGaN/GaN heterostructures were studied experimentally. It was found that graphene on AlGaN forms a high-quality Schottky barrier with the barrier height dependent on the bias. The apparent barrier heights for this kind of Schottky diode were found to be relatively high, varying within the range of φb = (1.0–1.26) eV. AlGaN/GaN fin-shaped field-effect transistors (finFETs) with a graphene gate were fabricated and studied. These devices demonstrated ~8 order of magnitude on/off ratio, subthreshold slope of ~1.3, and low subthreshold current in the sub-picoamperes range. The effective trap density responsible for the 1/f low-frequency noise was found within the range of (1–5) · 1019 eV−1 cm−3. These values are of the same order of magnitude as reported earlier and in AlGaN/GaN transistors with Ni/Au Schottky gate studied as a reference in the current study. 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subjects | Physics |
title | Graphene as a Schottky Barrier Contact to AlGaN/GaN Heterostructures |
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