$Beam damage of single semiconductor nanowires during X‐ray nanobeam diffraction experiments$

Beam damage of single semiconductor nanowires during X‐ray nanobeam diffraction experiments

Nanoprobe X‐ray diffraction (nXRD) using focused synchrotron radiation is a powerful technique to study the structural properties of individual semiconductor nanowires. However, when performing the experiment under ambient conditions, the required high X‐ray dose and prolonged exposure times can lea...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Journal of synchrotron radiation 2020-09, Vol.27 (5), p.1200-1208
Hauptverfasser:	Al Hassan, Ali, Lähnemann, Jonas, Davtyan, Arman, Al-Humaidi, Mahmoud, Herranz, Jesús, Bahrami, Danial, Anjum, Taseer, Bertram, Florian, Dey, Arka Bikash, Geelhaar, Lutz, Pietsch, Ullrich
Format:	Artikel
Sprache:	eng
Schlagworte:	air and He atmosphere Cathodoluminescence Diffraction Energy dissipation Exposure Gallium arsenide individual core–shell nanowires Mathematical morphology morphological and optical changes nanoprobe X‐ray exposure Nanowires Oxidation ozone‐induced oxidation Quantum wells Radiation damage Research Papers Spectrum analysis Synchrotron radiation Synchrotrons
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Schreiben Sie den ersten Kommentar!