AMST: Alignment to Median Smoothed Template for Focused Ion Beam Scanning Electron Microscopy Image Stacks

Alignment of stacks of serial images generated by Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) is generally performed using translations only, either through slice-by-slice alignments with SIFT or alignment by template matching. However, limitations of these methods are two-fold: the intr...

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Veröffentlicht in:	Scientific reports 2020-02, Vol.10 (1), p.2004-2004, Article 2004
Hauptverfasser:	Hennies, Julian, Lleti, José Miguel Serra, Schieber, Nicole L., Templin, Rachel M., Steyer, Anna M., Schwab, Yannick
Format:	Artikel
Sprache:	eng
Schlagworte:	631/114/1305 631/114/1314 631/114/1564 631/114/794 Datasets Humanities and Social Sciences Image processing Ion beams multidisciplinary Neural networks Organelles Scanning electron microscopy Science Science (multidisciplinary) Segmentation
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