Direct Three-Dimensional Measurement of Refractive Index via Dual Photon-Phonon Scattering
We developed a microscopy technique that can measure the local refractive index without sampling the optical phase delay of the electromagnetic radiation. To do this, we designed and experimentally demonstrated a setup with two colocalized Brillouin scattering interactions that couple to a common ac...
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| Veröffentlicht in: | Physical review letters 2019-03, Vol.122 (10), p.103901-103901, Article 103901 |
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| container_end_page | 103901 |
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| container_title | Physical review letters |
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| creator | Fiore, Antonio Bevilacqua, Carlo Scarcelli, Giuliano |
| description | We developed a microscopy technique that can measure the local refractive index without sampling the optical phase delay of the electromagnetic radiation. To do this, we designed and experimentally demonstrated a setup with two colocalized Brillouin scattering interactions that couple to a common acoustic phonon axis; in this scenario, the ratio of Brillouin frequency shifts depends on the refractive index, but not on any other mechanical and/or optical properties of the sample. Integrating the spectral measurement within a confocal microscope, the refractive index is mapped at micron-scale three-dimensional resolution. As the refractive index is probed in epidetection and without assumptions on the geometrical dimensions of the sample, this method may prove useful to characterize biological cells and tissues. |
| doi_str_mv | 10.1103/physrevlett.122.103901 |
| format | Article |
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As the refractive index is probed in epidetection and without assumptions on the geometrical dimensions of the sample, this method may prove useful to characterize biological cells and tissues.</description><subject>Dimensional measurement</subject><subject>Electromagnetic radiation</subject><subject>Optical properties</subject><subject>Phonons</subject><subject>Refractivity</subject><subject>Scattering</subject><issn>0031-9007</issn><issn>1079-7114</issn><issn>1079-7114</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNpdkUFP3DAQha2KChbKX0CReuGS7UzMOsmlUsW2FGmrIgoXLpbjjFmjrL3YTlT-fd0uRaWnscZv3jz7Y-wEYY4I_MN2_RQDTQOlNMeqmudeC_iGzRDqtqwRz_bYDIBj2QLUB-wwxgcAwEo0--yAQ8vzqZqxu6UNpFNxsw5E5dJuyEXrnRqKb6TiGCg3UuFNcU0mKJ3sRMWl6-lnMVlVLMcsvFr75F2Zi_Ou-KFVShSsu3_H3ho1RDp-rkfs9svnm_Ov5er7xeX5p1WpF9CksjMdKd2BbjVp01U1LRpo1QJ1rzrUqBukjnpRc8F7BVjrvhNGgzG8UXVF_Ih93Plux25Dvc6BgxrkNtiNCk_SKytf3zi7lvd-kmLB4UyIbHD6bBD840gxyY2NmoZBOfJjlFWVt2JOBVn6_j_pgx9D_q4_qhq5EMizSuxUOviYMZmXMAjyNz55lfFd07TK-GTGJ3f48uDJv095GfvLi_8CAXecuA</recordid><startdate>20190315</startdate><enddate>20190315</enddate><creator>Fiore, Antonio</creator><creator>Bevilacqua, Carlo</creator><creator>Scarcelli, Giuliano</creator><general>American Physical Society</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>7X8</scope><scope>5PM</scope></search><sort><creationdate>20190315</creationdate><title>Direct Three-Dimensional Measurement of Refractive Index via Dual Photon-Phonon Scattering</title><author>Fiore, Antonio ; Bevilacqua, Carlo ; Scarcelli, Giuliano</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c508t-bfbeacb0c9cecfb27e5809a51cdab1c1c81ebed67363da017cdb6fc0ff38a72e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Dimensional measurement</topic><topic>Electromagnetic radiation</topic><topic>Optical properties</topic><topic>Phonons</topic><topic>Refractivity</topic><topic>Scattering</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Fiore, Antonio</creatorcontrib><creatorcontrib>Bevilacqua, Carlo</creatorcontrib><creatorcontrib>Scarcelli, Giuliano</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>MEDLINE - Academic</collection><collection>PubMed Central (Full Participant titles)</collection><jtitle>Physical review letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Fiore, Antonio</au><au>Bevilacqua, Carlo</au><au>Scarcelli, Giuliano</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Direct Three-Dimensional Measurement of Refractive Index via Dual Photon-Phonon Scattering</atitle><jtitle>Physical review letters</jtitle><addtitle>Phys Rev Lett</addtitle><date>2019-03-15</date><risdate>2019</risdate><volume>122</volume><issue>10</issue><spage>103901</spage><epage>103901</epage><pages>103901-103901</pages><artnum>103901</artnum><issn>0031-9007</issn><issn>1079-7114</issn><eissn>1079-7114</eissn><abstract>We developed a microscopy technique that can measure the local refractive index without sampling the optical phase delay of the electromagnetic radiation. 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| ispartof | Physical review letters, 2019-03, Vol.122 (10), p.103901-103901, Article 103901 |
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| language | eng |
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| source | American Physical Society Journals; Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals |
| subjects | Dimensional measurement Electromagnetic radiation Optical properties Phonons Refractivity Scattering |
| title | Direct Three-Dimensional Measurement of Refractive Index via Dual Photon-Phonon Scattering |
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