A statistical approach to correct X‐ray response non‐uniformity in microstrip detectors for high‐accuracy and high‐resolution total‐scattering measurements

An unbiased approach to correct X‐ray response non‐uniformity in microstrip detectors has been developed based on the statistical estimation that the scattering intensity at a fixed angle from an object is expected to be constant within the Poisson noise. Raw scattering data of SiO2 glass measured b...

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