Free-electron laser data for multiple-particle fluctuation scattering analysis

Fluctuation X-ray scattering (FXS) is an emerging experimental technique in which solution scattering data are collected using X-ray exposures below rotational diffusion times, resulting in angularly anisotropic X-ray snapshots that provide several orders of magnitude more information than traditional solution scattering data. Such experiments can be performed using the ultrashort X-ray pulses provided by a free-electron laser source, allowing one to collect a large number of diffraction patterns in a relatively short time. Here, we describe a test data set for FXS, obtained at the Linac Coherent Light Source, consisting of close to 100 000 multi-particle diffraction patterns originating from approximately 50 to 200 Paramecium Bursaria Chlorella virus particles per snapshot. In addition to the raw data, a selection of high-quality pre-processed diffraction patterns and a reference SAXS profile are provided. Design Type(s) virus particle imaging objective Measurement Type(s) X-ray diffraction data Technology Type(s) X-ray free electron laser Factor Type(s) Sample Characteristic(s) Paramecium bursaria Chlorella virus 1 Machine-accessible metadata file describing the reported data (ISA-Tab format)