Analysis of Surface Extraction Methods Based on Gradient Operators for Computed Tomography in Metrology Applications
Among the multiple factors influencing the accuracy of Computed Tomography measurements, the surface extraction process is a significant contributor. The location of the surface for metrological applications is generally based on the definition of a gray value as a characteristic of similarity to de...
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| Veröffentlicht in: | Materials 2018-08, Vol.11 (8), p.1461 |
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| creator | Ontiveros, Sinué Jiménez, Roberto Yagüe-Fabra, José A Torralba, Marta |
| description | Among the multiple factors influencing the accuracy of Computed Tomography measurements, the surface extraction process is a significant contributor. The location of the surface for metrological applications is generally based on the definition of a gray value as a characteristic of similarity to define the regions of interest. A different approach is to perform the detection or location of the surface based on the discontinuity or gradient. In this paper, an adapted 3D Deriche algorithm based on gradient information is presented and compared with a previously developed adapted Canny algorithm for different surface types. Both algorithms have been applied to nine calibrated workpieces with different geometries and materials. Both the systematic error and measurement uncertainty have been determined. The results show a significant reduction of the deviations obtained with the Deriche-based algorithm in the dimensions defined by flat surfaces. |
| doi_str_mv | 10.3390/ma11081461 |
| format | Article |
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| source | MDPI - Multidisciplinary Digital Publishing Institute; Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals; PubMed Central; Free Full-Text Journals in Chemistry; PubMed Central Open Access |
| subjects | Algorithms Computation Computed tomography Error analysis Flat surfaces Measurement techniques Methods Tomography Workpieces |
| title | Analysis of Surface Extraction Methods Based on Gradient Operators for Computed Tomography in Metrology Applications |
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