Impact of thickness variation on structural, dielectric and piezoelectric properties of (Ba,Ca)(Ti,Zr)O3 epitaxial thin films
It is shown that the dielectric and piezoelectric properties of Ba(Ti 0.8 Zr 0.2 )O 3 -x(Ba 0.7 Ca 0.3 )TiO 3 (x = 0.45) (BCTZ 45) epitaxial thin films have a nontrivial dependence on film thickness. BCTZ 45 epitaxial films with different thicknesses (up to 400 nm) have been deposited on SrTiO 3 by...
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| Veröffentlicht in: | Scientific reports 2018-02, Vol.8 (1), p.1-9, Article 2056 |
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| creator | Ion, Valentin Craciun, Floriana Scarisoreanu, Nicu D. Moldovan, Antoniu Andrei, Andreea Birjega, Ruxandra Ghica, Corneliu Di Pietrantonio, Fabio Cannata, Domenico Benetti, Massimiliano Dinescu, Maria |
| description | It is shown that the dielectric and piezoelectric properties of Ba(Ti
0.8
Zr
0.2
)O
3
-x(Ba
0.7
Ca
0.3
)TiO
3
(x = 0.45) (BCTZ 45) epitaxial thin films have a nontrivial dependence on film thickness. BCTZ 45 epitaxial films with different thicknesses (up to 400 nm) have been deposited on SrTiO
3
by pulsed laser deposition and investigated by different combined techniques: conventional and off-axis X-ray diffraction, high resolution transmission electron microscopy and dielectric and piezoforce microscopy. The changes occurring in epitaxial films when their thickness increases have been attributed to a partial relaxation of misfit strain, driving the induced tetragonal symmetry in very thin films to the original rhombohedral symmetry of the bulk material in the thickest film, which influences directly and indirectly the dielectric and piezoelectric properties. |
| doi_str_mv | 10.1038/s41598-018-20149-y |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_pubme</sourceid><recordid>TN_cdi_pubmedcentral_primary_oai_pubmedcentral_nih_gov_5794999</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1993992589</sourcerecordid><originalsourceid>FETCH-LOGICAL-c451t-aa66ff631354e33bc09a820af6fc984f5cf9e4800f446cfd3235027d42d8a29d3</originalsourceid><addsrcrecordid>eNp1kU9rFTEUxYMottR-AVcBN6_wRvN3mmwE-7BaKHRTN27CbSZpU2cmY5IpPsHv3kxfKVUwBBJufufkXg5Cbyl5TwlXH7KgUquGUNUwQoVuti_QPiNCNowz9vLZfQ8d5nxL6pJMC6pfoz2muaaCyH3052yYwBYcPS43wf4YXc74DlKAEuKI684lzbbMCfo17oLrnS0pWAxjh6fgfsenypTi5FIJLi9uqxNYb-BodRnW39PRBcduCgV-BeiXj0bsQz_kN-iVhz67w8fzAH07_Xy5-dqcX3w523w6b6yQtDQAbet9yymXwnF-ZYkGxQj41luthJfWaycUIV6I1vqOMy4JO-4E6xQw3fED9HHnO81Xg-usG0udx0wpDJC2JkIwf7-M4cZcxzsjj7XQWleD1aNBij9nl4sZQrau72F0cc6GVkZrJtWCvvsHvY1zGut4DxRXkrOFYjvKpphzcv6pGUrMErDZBWxqwOYhYLOtIr4T5QqP1y49s_6_6h6K06k6</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1993385329</pqid></control><display><type>article</type><title>Impact of thickness variation on structural, dielectric and piezoelectric properties of (Ba,Ca)(Ti,Zr)O3 epitaxial thin films</title><source>Nature Open Access</source><source>DOAJ Directory of Open Access Journals</source><source>Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals</source><source>PubMed Central</source><source>Alma/SFX Local Collection</source><source>Springer Nature OA/Free Journals</source><source>Free Full-Text Journals in Chemistry</source><creator>Ion, Valentin ; Craciun, Floriana ; Scarisoreanu, Nicu D. ; Moldovan, Antoniu ; Andrei, Andreea ; Birjega, Ruxandra ; Ghica, Corneliu ; Di Pietrantonio, Fabio ; Cannata, Domenico ; Benetti, Massimiliano ; Dinescu, Maria</creator><creatorcontrib>Ion, Valentin ; Craciun, Floriana ; Scarisoreanu, Nicu D. ; Moldovan, Antoniu ; Andrei, Andreea ; Birjega, Ruxandra ; Ghica, Corneliu ; Di Pietrantonio, Fabio ; Cannata, Domenico ; Benetti, Massimiliano ; Dinescu, Maria</creatorcontrib><description>It is shown that the dielectric and piezoelectric properties of Ba(Ti
0.8
Zr
0.2
)O
3
-x(Ba
0.7
Ca
0.3
)TiO
3
(x = 0.45) (BCTZ 45) epitaxial thin films have a nontrivial dependence on film thickness. BCTZ 45 epitaxial films with different thicknesses (up to 400 nm) have been deposited on SrTiO
3
by pulsed laser deposition and investigated by different combined techniques: conventional and off-axis X-ray diffraction, high resolution transmission electron microscopy and dielectric and piezoforce microscopy. The changes occurring in epitaxial films when their thickness increases have been attributed to a partial relaxation of misfit strain, driving the induced tetragonal symmetry in very thin films to the original rhombohedral symmetry of the bulk material in the thickest film, which influences directly and indirectly the dielectric and piezoelectric properties.</description><identifier>ISSN: 2045-2322</identifier><identifier>EISSN: 2045-2322</identifier><identifier>DOI: 10.1038/s41598-018-20149-y</identifier><identifier>PMID: 29391405</identifier><language>eng</language><publisher>London: Nature Publishing Group UK</publisher><subject>142/126 ; 639/301/1023/1024 ; 639/301/119/544 ; 639/766/119/544 ; Humanities and Social Sciences ; Microscopy ; multidisciplinary ; Science ; Science (multidisciplinary) ; Thin films ; Transmission electron microscopy ; X-ray diffraction</subject><ispartof>Scientific reports, 2018-02, Vol.8 (1), p.1-9, Article 2056</ispartof><rights>The Author(s) 2018</rights><rights>2018. This work is published under http://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c451t-aa66ff631354e33bc09a820af6fc984f5cf9e4800f446cfd3235027d42d8a29d3</citedby><cites>FETCH-LOGICAL-c451t-aa66ff631354e33bc09a820af6fc984f5cf9e4800f446cfd3235027d42d8a29d3</cites><orcidid>0000-0002-4908-7448 ; 0000-0003-4072-0099 ; 0000-0002-4052-0022</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://www.ncbi.nlm.nih.gov/pmc/articles/PMC5794999/pdf/$$EPDF$$P50$$Gpubmedcentral$$Hfree_for_read</linktopdf><linktohtml>$$Uhttps://www.ncbi.nlm.nih.gov/pmc/articles/PMC5794999/$$EHTML$$P50$$Gpubmedcentral$$Hfree_for_read</linktohtml><link.rule.ids>230,314,723,776,780,860,881,27901,27902,41096,42165,51551,53766,53768</link.rule.ids></links><search><creatorcontrib>Ion, Valentin</creatorcontrib><creatorcontrib>Craciun, Floriana</creatorcontrib><creatorcontrib>Scarisoreanu, Nicu D.</creatorcontrib><creatorcontrib>Moldovan, Antoniu</creatorcontrib><creatorcontrib>Andrei, Andreea</creatorcontrib><creatorcontrib>Birjega, Ruxandra</creatorcontrib><creatorcontrib>Ghica, Corneliu</creatorcontrib><creatorcontrib>Di Pietrantonio, Fabio</creatorcontrib><creatorcontrib>Cannata, Domenico</creatorcontrib><creatorcontrib>Benetti, Massimiliano</creatorcontrib><creatorcontrib>Dinescu, Maria</creatorcontrib><title>Impact of thickness variation on structural, dielectric and piezoelectric properties of (Ba,Ca)(Ti,Zr)O3 epitaxial thin films</title><title>Scientific reports</title><addtitle>Sci Rep</addtitle><description>It is shown that the dielectric and piezoelectric properties of Ba(Ti
0.8
Zr
0.2
)O
3
-x(Ba
0.7
Ca
0.3
)TiO
3
(x = 0.45) (BCTZ 45) epitaxial thin films have a nontrivial dependence on film thickness. BCTZ 45 epitaxial films with different thicknesses (up to 400 nm) have been deposited on SrTiO
3
by pulsed laser deposition and investigated by different combined techniques: conventional and off-axis X-ray diffraction, high resolution transmission electron microscopy and dielectric and piezoforce microscopy. The changes occurring in epitaxial films when their thickness increases have been attributed to a partial relaxation of misfit strain, driving the induced tetragonal symmetry in very thin films to the original rhombohedral symmetry of the bulk material in the thickest film, which influences directly and indirectly the dielectric and piezoelectric properties.</description><subject>142/126</subject><subject>639/301/1023/1024</subject><subject>639/301/119/544</subject><subject>639/766/119/544</subject><subject>Humanities and Social Sciences</subject><subject>Microscopy</subject><subject>multidisciplinary</subject><subject>Science</subject><subject>Science (multidisciplinary)</subject><subject>Thin films</subject><subject>Transmission electron microscopy</subject><subject>X-ray diffraction</subject><issn>2045-2322</issn><issn>2045-2322</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><sourceid>C6C</sourceid><sourceid>BENPR</sourceid><recordid>eNp1kU9rFTEUxYMottR-AVcBN6_wRvN3mmwE-7BaKHRTN27CbSZpU2cmY5IpPsHv3kxfKVUwBBJufufkXg5Cbyl5TwlXH7KgUquGUNUwQoVuti_QPiNCNowz9vLZfQ8d5nxL6pJMC6pfoz2muaaCyH3052yYwBYcPS43wf4YXc74DlKAEuKI684lzbbMCfo17oLrnS0pWAxjh6fgfsenypTi5FIJLi9uqxNYb-BodRnW39PRBcduCgV-BeiXj0bsQz_kN-iVhz67w8fzAH07_Xy5-dqcX3w523w6b6yQtDQAbet9yymXwnF-ZYkGxQj41luthJfWaycUIV6I1vqOMy4JO-4E6xQw3fED9HHnO81Xg-usG0udx0wpDJC2JkIwf7-M4cZcxzsjj7XQWleD1aNBij9nl4sZQrau72F0cc6GVkZrJtWCvvsHvY1zGut4DxRXkrOFYjvKpphzcv6pGUrMErDZBWxqwOYhYLOtIr4T5QqP1y49s_6_6h6K06k6</recordid><startdate>20180201</startdate><enddate>20180201</enddate><creator>Ion, Valentin</creator><creator>Craciun, Floriana</creator><creator>Scarisoreanu, Nicu D.</creator><creator>Moldovan, Antoniu</creator><creator>Andrei, Andreea</creator><creator>Birjega, Ruxandra</creator><creator>Ghica, Corneliu</creator><creator>Di Pietrantonio, Fabio</creator><creator>Cannata, Domenico</creator><creator>Benetti, Massimiliano</creator><creator>Dinescu, Maria</creator><general>Nature Publishing Group UK</general><general>Nature Publishing Group</general><scope>C6C</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7X7</scope><scope>7XB</scope><scope>88A</scope><scope>88E</scope><scope>88I</scope><scope>8FE</scope><scope>8FH</scope><scope>8FI</scope><scope>8FJ</scope><scope>8FK</scope><scope>ABUWG</scope><scope>AEUYN</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BBNVY</scope><scope>BENPR</scope><scope>BHPHI</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FYUFA</scope><scope>GHDGH</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>K9.</scope><scope>LK8</scope><scope>M0S</scope><scope>M1P</scope><scope>M2P</scope><scope>M7P</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>Q9U</scope><scope>7X8</scope><scope>5PM</scope><orcidid>https://orcid.org/0000-0002-4908-7448</orcidid><orcidid>https://orcid.org/0000-0003-4072-0099</orcidid><orcidid>https://orcid.org/0000-0002-4052-0022</orcidid></search><sort><creationdate>20180201</creationdate><title>Impact of thickness variation on structural, dielectric and piezoelectric properties of (Ba,Ca)(Ti,Zr)O3 epitaxial thin films</title><author>Ion, Valentin ; Craciun, Floriana ; Scarisoreanu, Nicu D. ; Moldovan, Antoniu ; Andrei, Andreea ; Birjega, Ruxandra ; Ghica, Corneliu ; Di Pietrantonio, Fabio ; Cannata, Domenico ; Benetti, Massimiliano ; Dinescu, Maria</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c451t-aa66ff631354e33bc09a820af6fc984f5cf9e4800f446cfd3235027d42d8a29d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>142/126</topic><topic>639/301/1023/1024</topic><topic>639/301/119/544</topic><topic>639/766/119/544</topic><topic>Humanities and Social Sciences</topic><topic>Microscopy</topic><topic>multidisciplinary</topic><topic>Science</topic><topic>Science (multidisciplinary)</topic><topic>Thin films</topic><topic>Transmission electron microscopy</topic><topic>X-ray diffraction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ion, Valentin</creatorcontrib><creatorcontrib>Craciun, Floriana</creatorcontrib><creatorcontrib>Scarisoreanu, Nicu D.</creatorcontrib><creatorcontrib>Moldovan, Antoniu</creatorcontrib><creatorcontrib>Andrei, Andreea</creatorcontrib><creatorcontrib>Birjega, Ruxandra</creatorcontrib><creatorcontrib>Ghica, Corneliu</creatorcontrib><creatorcontrib>Di Pietrantonio, Fabio</creatorcontrib><creatorcontrib>Cannata, Domenico</creatorcontrib><creatorcontrib>Benetti, Massimiliano</creatorcontrib><creatorcontrib>Dinescu, Maria</creatorcontrib><collection>Springer Nature OA/Free Journals</collection><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Health & Medical Collection</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Biology Database (Alumni Edition)</collection><collection>Medical Database (Alumni Edition)</collection><collection>Science Database (Alumni Edition)</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Natural Science Collection</collection><collection>Hospital Premium Collection</collection><collection>Hospital Premium Collection (Alumni Edition)</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest One Sustainability</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central Essentials</collection><collection>Biological Science Collection</collection><collection>ProQuest Central</collection><collection>Natural Science Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Health Research Premium Collection</collection><collection>Health Research Premium Collection (Alumni)</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Health & Medical Complete (Alumni)</collection><collection>ProQuest Biological Science Collection</collection><collection>Health & Medical Collection (Alumni Edition)</collection><collection>Medical Database</collection><collection>Science Database</collection><collection>Biological Science Database</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central Basic</collection><collection>MEDLINE - Academic</collection><collection>PubMed Central (Full Participant titles)</collection><jtitle>Scientific reports</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ion, Valentin</au><au>Craciun, Floriana</au><au>Scarisoreanu, Nicu D.</au><au>Moldovan, Antoniu</au><au>Andrei, Andreea</au><au>Birjega, Ruxandra</au><au>Ghica, Corneliu</au><au>Di Pietrantonio, Fabio</au><au>Cannata, Domenico</au><au>Benetti, Massimiliano</au><au>Dinescu, Maria</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Impact of thickness variation on structural, dielectric and piezoelectric properties of (Ba,Ca)(Ti,Zr)O3 epitaxial thin films</atitle><jtitle>Scientific reports</jtitle><stitle>Sci Rep</stitle><date>2018-02-01</date><risdate>2018</risdate><volume>8</volume><issue>1</issue><spage>1</spage><epage>9</epage><pages>1-9</pages><artnum>2056</artnum><issn>2045-2322</issn><eissn>2045-2322</eissn><abstract>It is shown that the dielectric and piezoelectric properties of Ba(Ti
0.8
Zr
0.2
)O
3
-x(Ba
0.7
Ca
0.3
)TiO
3
(x = 0.45) (BCTZ 45) epitaxial thin films have a nontrivial dependence on film thickness. BCTZ 45 epitaxial films with different thicknesses (up to 400 nm) have been deposited on SrTiO
3
by pulsed laser deposition and investigated by different combined techniques: conventional and off-axis X-ray diffraction, high resolution transmission electron microscopy and dielectric and piezoforce microscopy. The changes occurring in epitaxial films when their thickness increases have been attributed to a partial relaxation of misfit strain, driving the induced tetragonal symmetry in very thin films to the original rhombohedral symmetry of the bulk material in the thickest film, which influences directly and indirectly the dielectric and piezoelectric properties.</abstract><cop>London</cop><pub>Nature Publishing Group UK</pub><pmid>29391405</pmid><doi>10.1038/s41598-018-20149-y</doi><tpages>9</tpages><orcidid>https://orcid.org/0000-0002-4908-7448</orcidid><orcidid>https://orcid.org/0000-0003-4072-0099</orcidid><orcidid>https://orcid.org/0000-0002-4052-0022</orcidid><oa>free_for_read</oa></addata></record> |
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| source | Nature Open Access; DOAJ Directory of Open Access Journals; Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals; PubMed Central; Alma/SFX Local Collection; Springer Nature OA/Free Journals; Free Full-Text Journals in Chemistry |
| subjects | 142/126 639/301/1023/1024 639/301/119/544 639/766/119/544 Humanities and Social Sciences Microscopy multidisciplinary Science Science (multidisciplinary) Thin films Transmission electron microscopy X-ray diffraction |
| title | Impact of thickness variation on structural, dielectric and piezoelectric properties of (Ba,Ca)(Ti,Zr)O3 epitaxial thin films |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-06T04%3A55%3A50IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_pubme&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Impact%20of%20thickness%20variation%20on%20structural,%20dielectric%20and%20piezoelectric%20properties%20of%20(Ba,Ca)(Ti,Zr)O3%20epitaxial%20thin%20films&rft.jtitle=Scientific%20reports&rft.au=Ion,%20Valentin&rft.date=2018-02-01&rft.volume=8&rft.issue=1&rft.spage=1&rft.epage=9&rft.pages=1-9&rft.artnum=2056&rft.issn=2045-2322&rft.eissn=2045-2322&rft_id=info:doi/10.1038/s41598-018-20149-y&rft_dat=%3Cproquest_pubme%3E1993992589%3C/proquest_pubme%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1993385329&rft_id=info:pmid/29391405&rfr_iscdi=true |