Controlled tip wear on high roughness surfaces yields gradual broadening and rounding of cantilever tips

Tip size in atomic force microscopy (AFM) has a major impact on the resolution of images and on the results of nanoindentation experiments. Tip wear is therefore a key limitation in the application of AFM. Here we show, however, how wear can be turned into an advantage as it allows for directed tip...

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Veröffentlicht in:	Scientific reports 2016-11, Vol.6 (1), p.36972-36972, Article 36972
Hauptverfasser:	Vorselen, Daan, Kooreman, Ernst S., Wuite, Gijs J. L., Roos, Wouter H.
Format:	Artikel
Sprache:	eng
Schlagworte:	639/301/357 639/925 Atomic force microscopy Data processing Humanities and Social Sciences Mechanical properties Microscopes multidisciplinary Science Spectroscopy Tips & tipping Titanium
Online-Zugang:	Volltext
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